@inproceedings{d1736281e02c429dac06db4a5f6df0df,
title = "A two-phase fault simulation scheme for sequential circuits",
abstract = "A two-phase fault simulation scheme for sequential circuits is proposed. The scheme is done by first performing the true value simulation with several initial patterns and then by performing the fault simulation with the rest of patterns. With the fault simulation approach, some faults which consume much simulation time can be easily and quickly identified and dropped early. As a result, significant speedup on simulation time is obtained. Five cases of faults which cause problems in fault simulation are also discussed.",
author = "Wu, {W. C.} and Lee, {C. L.} and Chen, {J. E.}",
note = "Publisher Copyright: {\textcopyright} 1993 IEEE.; 2nd IEEE Asian Test Symposium, ATS 1993 ; Conference date: 16-11-1993 Through 18-11-1993",
year = "1993",
doi = "10.1109/ATS.1993.398780",
language = "???core.languages.en_GB???",
series = "Proceedings of the Asian Test Symposium",
publisher = "IEEE Computer Society",
pages = "60--65",
booktitle = "ATS 1993 Proceedings - 2nd Asian Test Symposium",
}