A testing scheme for crosstalk faults based on the oscillation test signal [VLSI]

Ming Shae Wu, Chung Len Lee, Chi Peng Chang, J. E. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

A test scheme for crosstalk faults, based on an oscillation signal, is proposed. It uses an oscillation signal applied to an affecting line and detects induced pulses on a victim line if a crosstalk fault exists between these two lines. It is simple and eliminates the complicated timing issues during test generation for crosstalk faults in conventional approaches. The test generation and fault simulation based on the scheme are described. Experimental results are also presented to show the described test generation procedure is effective in generating test patterns for this scheme.

Original languageEnglish
Title of host publicationProceedings of the 11th Asian Test Symposium, ATS 2002
PublisherIEEE Computer Society
Pages170-175
Number of pages6
ISBN (Electronic)0769518257, 0769518257
DOIs
StatePublished - 2002
Event11th Asian Test Symposium, ATS 2002 - Guam, United States
Duration: 18 Nov 200220 Nov 2002

Publication series

NameProceedings of the Asian Test Symposium
Volume2002-January
ISSN (Print)1081-7735

Conference

Conference11th Asian Test Symposium, ATS 2002
Country/TerritoryUnited States
CityGuam
Period18/11/0220/11/02

Keywords

  • Circuit faults
  • Circuit simulation
  • Circuit testing
  • Crosstalk
  • Electrical fault detection
  • Fault detection
  • Pattern analysis
  • Pulse circuits
  • Test pattern generators
  • Timing

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