@inproceedings{516fc35bf3294846b1411e5ec29f0a91,
title = "A testing scheme for crosstalk faults based on the oscillation test signal [VLSI]",
abstract = "A test scheme for crosstalk faults, based on an oscillation signal, is proposed. It uses an oscillation signal applied to an affecting line and detects induced pulses on a victim line if a crosstalk fault exists between these two lines. It is simple and eliminates the complicated timing issues during test generation for crosstalk faults in conventional approaches. The test generation and fault simulation based on the scheme are described. Experimental results are also presented to show the described test generation procedure is effective in generating test patterns for this scheme.",
keywords = "Circuit faults, Circuit simulation, Circuit testing, Crosstalk, Electrical fault detection, Fault detection, Pattern analysis, Pulse circuits, Test pattern generators, Timing",
author = "Wu, {Ming Shae} and Lee, {Chung Len} and Chang, {Chi Peng} and Chen, {J. E.}",
note = "Publisher Copyright: {\textcopyright} 2002 IEEE.; null ; Conference date: 18-11-2002 Through 20-11-2002",
year = "2002",
doi = "10.1109/ATS.2002.1181706",
language = "???core.languages.en_GB???",
series = "Proceedings of the Asian Test Symposium",
publisher = "IEEE Computer Society",
pages = "170--175",
booktitle = "Proceedings of the 11th Asian Test Symposium, ATS 2002",
}