A Test Method for Finding Boundary Currents of 1T1R Memristor Memories

Tzu Ying Lin, Yong Xiao Chen, Jin Fu Li, Chih Yen Lo, Ding Ming Kwai, Yung Fa Chou

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

1 results

Finished
應用於三維積體電路可測性及可靠性設計技術-總計畫暨子計畫一：三維積體電路中堆疊式記憶體與晶粒間連接線可測性與可靠性技術
Li, J.-F. (PI)
1/05/15 → 31/07/16
Project: Research