A study on coverage problem of network planning in LTE-advanced relay networks

Fan Hsun Tseng, Chi Yuan Chen, Li Der Chou, Tin Yu Wu, Han Chieh Chao

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

14 Scopus citations

Abstract

In recent years new research studies have appeared that concern the issue of network planning in LTE-Advanced. In this paper, the coverage problem in LTE-Advanced relay networks is formulated based on integer linear programming (ILP). We propose the Enhanced tree (E-Tree) algorithm to place the evolved Node B (eNB) and relay station (RS) at the location which has the lowest construction cost. The goal is not only satisfy the minimum requirement but also meet the two hop relaying limitation in LTE-Advanced networks. The E-Tree algorithm is proposed based on graph theoretic technique, and analyzed with the simulation results. The simulation results show that the proposed algorithm provides a rapid planning method and the lowest construction cost with various network environment.

Original languageEnglish
Title of host publicationProceedings - 26th IEEE International Conference on Advanced Information Networking and Applications, AINA 2012
Pages944-950
Number of pages7
DOIs
StatePublished - 2012
Event26th IEEE International Conference on Advanced Information Networking and Applications, AINA 2012 - Fukuoka, Japan
Duration: 26 Mar 201229 Mar 2012

Publication series

NameProceedings - International Conference on Advanced Information Networking and Applications, AINA
ISSN (Print)1550-445X

Conference

Conference26th IEEE International Conference on Advanced Information Networking and Applications, AINA 2012
Country/TerritoryJapan
CityFukuoka
Period26/03/1229/03/12

Keywords

  • graph theory
  • integer linear programming
  • LTE-Advanced
  • network planning
  • relay networks

Fingerprint

Dive into the research topics of 'A study on coverage problem of network planning in LTE-advanced relay networks'. Together they form a unique fingerprint.

Cite this