Abstract
The analysis on test beam data of a large silicon microstrip detector is presented. The spatial resolution has been studied with full GEANT simulation to calculate the systematic uncertainty due to multiple scattering. Several cluster position-finding algorithms have been applied for inclined tracks. The cluster profile and spatial resolution have the predicted geometrical correlation to the track angle.
Original language | English |
---|---|
Pages (from-to) | 538-544 |
Number of pages | 7 |
Journal | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
Volume | 363 |
Issue number | 3 |
DOIs | |
State | Published - 11 Sep 1995 |