A study of the charge cluster characteristics and spatial resolution of a silicon microstrip detector

Yuan Hann Chang, Augustine E. Chen, Suen R. Hou, Willis T. Lin

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

The analysis on test beam data of a large silicon microstrip detector is presented. The spatial resolution has been studied with full GEANT simulation to calculate the systematic uncertainty due to multiple scattering. Several cluster position-finding algorithms have been applied for inclined tracks. The cluster profile and spatial resolution have the predicted geometrical correlation to the track angle.

Original languageEnglish
Pages (from-to)538-544
Number of pages7
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume363
Issue number3
DOIs
StatePublished - 11 Sep 1995

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