A single-state-transition fault model for sequential machines

Kwang Ting Cheng, Jing Yang Jou

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

21 Scopus citations

Abstract

A fault model in the state transition level of finite state machines is studied. In this model, called a single-state-transition (SST) fault model, a fault causes a state transition to go to a wrong destination state while leaving its input/output label intact. An analysis is given to show that a test set that detects all SST faults will also detect most multiple-state-transition (MST) faults in practical finite state machines. It is shown that, for a N-state M-transition machine, the length of the SST fault test set is upper-bounded by 2 × M × N2 while the length is exponential in terms of N for a checking experiment. Experimental results show that the test set generated for SST faults achieves not only a high single stuck-at fault coverage but also a high transistor fault coverage for a multilevel implementation of the machine.

Original languageEnglish
Title of host publication1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers
PublisherPubl by IEEE
Pages226-229
Number of pages4
ISBN (Print)0818620552
StatePublished - 1990
Event1990 IEEE International Conference on Computer-Aided Design - ICCAD-90 - Santa Clara, CA, USA
Duration: 11 Nov 199015 Nov 1990

Publication series

Name1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers

Conference

Conference1990 IEEE International Conference on Computer-Aided Design - ICCAD-90
CitySanta Clara, CA, USA
Period11/11/9015/11/90

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