A Pulsed RTN Transient Measurement Technique: Demonstration on the Understanding of the Switching in Resistance Memory

E. R. Hsieh, H. W. Cheng, Z. H. Huang, C. H. Chuang, S. P. Yang, Steve S. Chung

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

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Keyphrases

Engineering

Material Science

Physics