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A Pulsed RTN Transient Measurement Technique: Demonstration on the Understanding of the Switching in Resistance Memory
E. R. Hsieh, H. W. Cheng, Z. H. Huang, C. H. Chuang, S. P. Yang, Steve S. Chung
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
3
Scopus
citations