@inproceedings{94341adaf2a04db7bd534b818d37609d,
title = "A novel in-situ roughness measurement based on spatial average analysis of binary speckle image",
abstract = "This study proposes a novel optical technique and method for in-situ roughness measurement. The speckle image was obtained by illuminating a laser beam and the reflected laser pattern image from a surface was binarizd and examined. The intensity distribution of binary image utilizes the combined effects of speckle and scattering phenomena. A new parameter of intensity distribution of binary image, SdBD has been proposed and the surface roughness parameter Ra of machined surfaces (ground) were correlated experimentally. Measurement results demonstrate an excellent correlation between the SdBD and Ra with correlation coefficient of 0.9706. The practicality of the proposed method to in-situ roughness measurement was applied to six samples from roughness Ra 0.2 to 6.25μm (0.3 λ and 10 λ, where λ is diode laser wavelength) of steel through grinding process.",
keywords = "Binary speckle images, In-situ measurement, Spatial average, Surface roughness",
author = "Hsu, {Kuo Chan} and Fuh, {Yiin Kuen}",
year = "2011",
doi = "10.4028/www.scientific.net/AMR.154-155.1125",
language = "???core.languages.en_GB???",
isbn = "9780878492046",
series = "Advanced Materials Research",
pages = "1125--1130",
booktitle = "Materials Processing Technologies",
note = "2010 International Conference on Advances in Materials and Manufacturing Processes, ICAMMP 2010 ; Conference date: 06-11-2010 Through 08-11-2010",
}