A novel in-situ roughness measurement based on spatial average analysis of binary speckle image

Kuo Chan Hsu, Yiin Kuen Fuh

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

This study proposes a novel optical technique and method for in-situ roughness measurement. The speckle image was obtained by illuminating a laser beam and the reflected laser pattern image from a surface was binarizd and examined. The intensity distribution of binary image utilizes the combined effects of speckle and scattering phenomena. A new parameter of intensity distribution of binary image, SdBD has been proposed and the surface roughness parameter Ra of machined surfaces (ground) were correlated experimentally. Measurement results demonstrate an excellent correlation between the SdBD and Ra with correlation coefficient of 0.9706. The practicality of the proposed method to in-situ roughness measurement was applied to six samples from roughness Ra 0.2 to 6.25μm (0.3 λ and 10 λ, where λ is diode laser wavelength) of steel through grinding process.

Original languageEnglish
Title of host publicationMaterials Processing Technologies
Pages1125-1130
Number of pages6
DOIs
StatePublished - 2011
Event2010 International Conference on Advances in Materials and Manufacturing Processes, ICAMMP 2010 - Shenzhen, China
Duration: 6 Nov 20108 Nov 2010

Publication series

NameAdvanced Materials Research
Volume154-155
ISSN (Print)1022-6680

Conference

Conference2010 International Conference on Advances in Materials and Manufacturing Processes, ICAMMP 2010
Country/TerritoryChina
CityShenzhen
Period6/11/108/11/10

Keywords

  • Binary speckle images
  • In-situ measurement
  • Spatial average
  • Surface roughness

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