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A Novel Approach to Localize the Channel Temperature Induced by the Self-heating Effect in 14nm High-k Metal-gate FinFET
E. R. Hsieh, M. J. Jiang, H. W. Chen, J. L. Lin, Steve S. Chung, T. P. Chen, Y. H. Yeah, T. J. Chen, Osbert Cheng
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1
Scopus
citations