A New Hyperspectral Discrimination Measure for Spectral Similarity

Yingzi Du, Chein I. Chang, Hsuan Ren, Francis D'Amico, James O. Jensen

Research output: Contribution to journalConference articlepeer-review

5 Scopus citations

Abstract

Spectral angle mapper (SAM) has been widely used as a spectral similarity measure for multispectral and hyperspectral image analysis. It has been shown to be equivalent to Euclidean distance when the spectral angle is relatively small. Most recently, a stochastic measure, called spectral information divergence (SID) has been introduced to model the spectrum of a hyperspectral image pixel as a probability distribution so that spectral variations can be captured more effectively in a stochastic manner. This paper develops a new hyperspectral spectral discrimantion measure, which is a mixture of SID and SAM. More specifically, let x i and x j denote two hyperspectral image pixel vectors with their corresponding spectra specified by s i and s j. SAM is the spectral angle of x i and x j and is defined by (SAM(s i,s j)). Similarly, SID measures the information divergence between x i and x j and is defined by (SID(s i,s j)). The new measure, referred to as (SID,SAM)-mixed measure has two variations defined by SID(s i,s j)×tan(SAM(s i,s j)) and SID(s i,s j)×sin(SAM(s i,s j)) where tan(SAM(s i,s j)) and sin(SAM(s i,s j)) are the tangent and the sine of the angle between vectors x and y. The advantage of the developed (SID,SAM)-mixed measure combines both strengths of SID and SAM in spectral discriminability. In order to demonstrate its utility, a comparative study is conducted among the new measure, SID and SAM where the discriminatory power of the (SID,SAM)-mixed measure is significantly improved over SID and SAM.

Original languageEnglish
Pages (from-to)430-439
Number of pages10
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5093
DOIs
StatePublished - 2003
EventAlgorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery IX - Orlando, FL, United States
Duration: 21 Apr 200324 Apr 2003

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