A multilayer data copy scheme for low cost test with controlled scan-in power for multiple scan chain designs

Shih Ping Lin, Chung Len Lee, Jwu E. Chen, Ji Jan Chen, Kun Lun Luo, Wen Ching Wu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

The random-like filling strategy pursuing high compression for scan test introduces large test power. To pursue high compression in conjunction with reducing test power for multiple scan chain designs is even harder and very few works were dedicated to solve this problem. This paper proposes and demonstrates a Multilayer Data Copy (MDC) scheme for test compression as well as test power reduction for multiple scan designs. The scheme utilizes a buffer, which supports fast load using previous loaded data, to achieve test data compression and test power reduction at the same time. The scheme can be applied A TPG-independently or to be incorporated in an ATPG to generate highly compressible and power efficient test sets. Experiment results on benchmarks show that test sets generated by the scheme had large compression and power saving with little area design overhead.

Original languageEnglish
Title of host publication2006 IEEE International Test Conference, ITC
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)1424402921, 9781424402922
DOIs
StatePublished - 2006
Event2006 IEEE International Test Conference, ITC - Santa Clara, CA, United States
Duration: 22 Oct 200627 Oct 2006

Publication series

NameProceedings - International Test Conference
ISSN (Print)1089-3539

Conference

Conference2006 IEEE International Test Conference, ITC
Country/TerritoryUnited States
CitySanta Clara, CA
Period22/10/0627/10/06

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