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A hybrid built-in self-test scheme for DRAMs
Chi Chun Yang, Jin Fu Li, Yun Chao Yu, Kuan Te Wu, Chih Yen Lo, Chao Hsun Chen, Jenn Shiang Lai, Ding Ming Kwai, Yung Fa Chou
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
6
Scopus
citations