A high-resolution technique for flicker measurement in power quality monitoring

Cheng I. Chen, Yeong Chin Chen, Chao Nan Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

Flicker is one of significant power quality disturbances, which may lead to serious voltage fluctuation. Therefore, the accurate estimation of flicker components plays an important role in the power quality monitoring and protection of power system. In this paper, a high-resolution technique is proposed to extract the flicker components effectively. Different from the conventional spectral analysis methods, the performance of proposed mechanism would not be influenced by the fundamental frequency deviation, the sampling frequency, and the length of sampled data. With the experimental test, the estimation accuracy and robustness are verified.

Original languageEnglish
Title of host publicationProceedings of the 2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013
Pages528-533
Number of pages6
DOIs
StatePublished - 2013
Event2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013 - Melbourne, VIC, Australia
Duration: 19 Jun 201321 Jun 2013

Publication series

NameProceedings of the 2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013

Conference

Conference2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013
Country/TerritoryAustralia
CityMelbourne, VIC
Period19/06/1321/06/13

Keywords

  • flicker
  • flickermeter
  • fundamental frequency deviation
  • high-resolution technique
  • power quality

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