A technique to automatically derive and inject meaningful internal faults of C-modeled primitives using a high-level synthesis tool, called CONES, is presented. The realistic internal faults are derived from an optimized two-level implementation of the functional primitives synthesized by CONES. The concept of a parameterized C-model is developed to introduce fault effects for fault simulation. This technique has been verified using AT&T's in-house CAD tools. The experiments show fairly promising and interesting results.
|Number of pages||3|
|State||Published - 1990|
|Event||Proceedings of the 32nd Midwest Symposium on Circuits and Systems Part 2 (of 2) - Champaign, IL, USA|
Duration: 14 Aug 1989 → 16 Aug 1989
|Conference||Proceedings of the 32nd Midwest Symposium on Circuits and Systems Part 2 (of 2)|
|City||Champaign, IL, USA|
|Period||14/08/89 → 16/08/89|