A high-level fault modeling technique using CONES

Jing Yang Jou; Tonysheng Lin

A high-level fault modeling technique using CONES

Department of Electrical Engineering

Research output: Contribution to conference › Paper › peer-review

Abstract

A technique to automatically derive and inject meaningful internal faults of C-modeled primitives using a high-level synthesis tool, called CONES, is presented. The realistic internal faults are derived from an optimized two-level implementation of the functional primitives synthesized by CONES. The concept of a parameterized C-model is developed to introduce fault effects for fault simulation. This technique has been verified using AT&T's in-house CAD tools. The experiments show fairly promising and interesting results.

Original language	English
Pages	287-289
Number of pages	3
State	Published - 1990
Event	Proceedings of the 32nd Midwest Symposium on Circuits and Systems Part 2 (of 2) - Champaign, IL, USA Duration: 14 Aug 1989 → 16 Aug 1989

Conference

Conference	Proceedings of the 32nd Midwest Symposium on Circuits and Systems Part 2 (of 2)
City	Champaign, IL, USA
Period	14/08/89 → 16/08/89

Cite this

@conference{592c59151d804608b4d2c572139053bc,

title = "A high-level fault modeling technique using CONES",

abstract = "A technique to automatically derive and inject meaningful internal faults of C-modeled primitives using a high-level synthesis tool, called CONES, is presented. The realistic internal faults are derived from an optimized two-level implementation of the functional primitives synthesized by CONES. The concept of a parameterized C-model is developed to introduce fault effects for fault simulation. This technique has been verified using AT&T's in-house CAD tools. The experiments show fairly promising and interesting results.",

author = "Jou, {Jing Yang} and Tonysheng Lin",

year = "1990",

language = "???core.languages.en_GB???",

pages = "287--289",

note = "Proceedings of the 32nd Midwest Symposium on Circuits and Systems Part 2 (of 2) ; Conference date: 14-08-1989 Through 16-08-1989",

}

TY - CONF

T1 - A high-level fault modeling technique using CONES

AU - Jou, Jing Yang

AU - Lin, Tonysheng

PY - 1990

Y1 - 1990

N2 - A technique to automatically derive and inject meaningful internal faults of C-modeled primitives using a high-level synthesis tool, called CONES, is presented. The realistic internal faults are derived from an optimized two-level implementation of the functional primitives synthesized by CONES. The concept of a parameterized C-model is developed to introduce fault effects for fault simulation. This technique has been verified using AT&T's in-house CAD tools. The experiments show fairly promising and interesting results.

AB - A technique to automatically derive and inject meaningful internal faults of C-modeled primitives using a high-level synthesis tool, called CONES, is presented. The realistic internal faults are derived from an optimized two-level implementation of the functional primitives synthesized by CONES. The concept of a parameterized C-model is developed to introduce fault effects for fault simulation. This technique has been verified using AT&T's in-house CAD tools. The experiments show fairly promising and interesting results.

UR - http://www.scopus.com/inward/record.url?scp=0025641484&partnerID=8YFLogxK

M3 - 會議論文

AN - SCOPUS:0025641484

SP - 287

EP - 289

T2 - Proceedings of the 32nd Midwest Symposium on Circuits and Systems Part 2 (of 2)

Y2 - 14 August 1989 through 16 August 1989

ER -

A high-level fault modeling technique using CONES

Abstract

Conference

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