A hierarchical test methodology for systems on chip

Jin Fu Li, Hsin Jung Huang, Jeng Bin Chen, Chih Pin Su, Cheng Wen Wu, Chuang Cheng, Shao I. Chen, Chi Yi Hwang, Hsiao Ping Lin

Research output: Contribution to journalArticlepeer-review

17 Scopus citations
Original languageEnglish
Pages (from-to)69-81
Number of pages13
JournalIEEE Micro
Volume22
Issue number5
DOIs
StatePublished - Sep 2002

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