A fast and sensitive built-in current sensor for IDDQ testing

Chih Wen Lu, Chung Len Lee, Jwu E. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

18 Scopus citations

Fingerprint

Dive into the research topics of 'A fast and sensitive built-in current sensor for IDDQ testing'. Together they form a unique fingerprint.

Keyphrases

Engineering