A fast and sensitive built-in current sensor for IDDQ testing

Chih Wen Lu; Chung Len Lee; Jwu E. Chen

doi:10.1109/IDDQ.1996.557816

A fast and sensitive built-in current sensor for IDDQ testing

Chih Wen Lu, Chung Len Lee, Jwu E. Chen

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

18 Scopus citations

Abstract

In this work, a fast and highly sensitive Built-in Current (BIC) sensor is proposed for testing static CMOS ICs. The sensor employs a current mirror and an I-V converter to achieve the high sensing speed and high resolution. The circuit is simple and occupies a small area, making it ideal to be integrated into the IC chip for the IDDQ application.

Original language	English
Title of host publication	Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996
Editors	Carol Tong, Anura Jayasuniana
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	56-58
Number of pages	3
ISBN (Electronic)	0818676558, 9780818676550
DOIs	https://doi.org/10.1109/IDDQ.1996.557816
State	Published - 1996
Event	1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996 - Washington, United States Duration: 24 Oct 1996 → 25 Oct 1996

Publication series

Name	Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996

Conference

Conference	1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996
Country/Territory	United States
City	Washington
Period	24/10/96 → 25/10/96

Access to Document

10.1109/IDDQ.1996.557816

Cite this

Lu, C. W., Lee, C. L., & Chen, J. E. (1996). A fast and sensitive built-in current sensor for IDDQ testing. In C. Tong, & A. Jayasuniana (Eds.), Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996 (pp. 56-58). Article 557816 (Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IDDQ.1996.557816

Lu, Chih Wen ; Lee, Chung Len ; Chen, Jwu E. / A fast and sensitive built-in current sensor for IDDQ testing. Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996. editor / Carol Tong ; Anura Jayasuniana. Institute of Electrical and Electronics Engineers Inc., 1996. pp. 56-58 (Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996).

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title = "A fast and sensitive built-in current sensor for IDDQ testing",

abstract = "In this work, a fast and highly sensitive Built-in Current (BIC) sensor is proposed for testing static CMOS ICs. The sensor employs a current mirror and an I-V converter to achieve the high sensing speed and high resolution. The circuit is simple and occupies a small area, making it ideal to be integrated into the IC chip for the IDDQ application.",

author = "Lu, {Chih Wen} and Lee, {Chung Len} and Chen, {Jwu E.}",

note = "Publisher Copyright: {\textcopyright} 1996 IEEE.; 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996 ; Conference date: 24-10-1996 Through 25-10-1996",

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series = "Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996",

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Lu, CW, Lee, CL & Chen, JE 1996, A fast and sensitive built-in current sensor for IDDQ testing. in C Tong & A Jayasuniana (eds), Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996., 557816, Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996, Institute of Electrical and Electronics Engineers Inc., pp. 56-58, 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996, Washington, United States, 24/10/96. https://doi.org/10.1109/IDDQ.1996.557816

A fast and sensitive built-in current sensor for IDDQ testing. / Lu, Chih Wen; Lee, Chung Len; Chen, Jwu E.
Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996. ed. / Carol Tong; Anura Jayasuniana. Institute of Electrical and Electronics Engineers Inc., 1996. p. 56-58 557816 (Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Lee, Chung Len

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AB - In this work, a fast and highly sensitive Built-in Current (BIC) sensor is proposed for testing static CMOS ICs. The sensor employs a current mirror and an I-V converter to achieve the high sensing speed and high resolution. The circuit is simple and occupies a small area, making it ideal to be integrated into the IC chip for the IDDQ application.

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BT - Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996

A2 - Tong, Carol

A2 - Jayasuniana, Anura

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996

Y2 - 24 October 1996 through 25 October 1996

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Lu CW, Lee CL, Chen JE. A fast and sensitive built-in current sensor for IDDQ testing. In Tong C, Jayasuniana A, editors, Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996. Institute of Electrical and Electronics Engineers Inc. 1996. p. 56-58. 557816. (Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996). doi: 10.1109/IDDQ.1996.557816

A fast and sensitive built-in current sensor for IDDQ testing

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