@inproceedings{5756352c95d64e33b285c74ba16142dd,
title = "A Deep Learning-based Generic Solder Defect Detection System",
abstract = "Automated optical inspection (AOI) is essential in the electronic manufacturing production line. Strict screening rules lead to a high false alarm rate of AOI. Many industries use AI models to classify defects. The lack of flawed data and the uneven distribution of categories is a big challenge for model training. Furthermore, the AI model must be retrained when adding new production line data, and the time cost is high. In order to reduce the false alarm rate and improve the generalization of the AI model, we build a deep learning- based generic solder defect detection system (GSDD) to classify defects into seven types. In GSDD, the color gradation adjustment module solves the problem of color difference, and the data augmentation module solves the problem of variable data. In the experiment, we use the data set provided by the enterprise to evaluate the accuracy of the model to 96%, and the model can be applied to different machines. Thus, GSDD is a general model and can efficiently detect defects.",
author = "Ye, {Shi Qi} and Xue, {Chen Sheng} and Jian, {Cheng Yuan} and Chen, {Yi Zhen} and Gung, {Jia Jiun} and Lin, {Chia Yu}",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022 ; Conference date: 06-07-2022 Through 08-07-2022",
year = "2022",
doi = "10.1109/ICCE-Taiwan55306.2022.9869217",
language = "???core.languages.en_GB???",
series = "Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "99--100",
booktitle = "Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022",
}