A comprehensive transport model for high performance HEMTs considering the parasitic resistance and capacitance effects

C. M. Hung, K. C. Li, E. R. Hsieh, C. T. Wang, C. I. Kou, Edward Y. Chang, Steve S. Chung

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Chemical Compounds

Engineering & Materials Science