A Built-in Spice Time-domain Variation Model of the BTI-induced Random Trap Fluctuation (RTF) in 14 nm FinFETs

L. C. Lin, Z. Y. Wang, M. Y. Lee, J. K. Chang, E. R. Hsieh, J. C. Guo, Steve S. Chung

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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