@inproceedings{2f67d0fd080f42b0a65f6881acf790b3,
title = "A built-in self-Test scheme for classifying refresh periods of DRAMs",
abstract = "A DRAM with multiple-refresh-period (MRP) method is one of effective refresh power reduction techniques. To support the MRP method, effective test methods for classifying the refresh period of each DRAM block are needed. In this paper, we propose an effective test method for classifying the refresh periods of DRAM blocks. Also, a programmable built-in self-Test (BIST) scheme being able to support the test method is proposed.",
author = "Chang, {Chia Ming} and Chen, {Yong Xiao} and Li, {Jin Fu}",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 22nd IEEE European Test Symposium, ETS 2017 ; Conference date: 22-05-2017 Through 26-05-2017",
year = "2017",
month = jul,
day = "3",
doi = "10.1109/ETS.2017.7968245",
language = "???core.languages.en_GB???",
series = "Proceedings of the European Test Workshop",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "Proceedings - 2017 22nd IEEE European Test Symposium, ETS 2017",
}