A BIST scheme with the ability of diagnostic data compression for RAMs

Chih Sheng Hou, Jin Fu Li, Ting Jun Fu

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

This paper proposes a built-in self-test (BIST) scheme with syndrome-compression ability for random access memories (RAMs) with static (SF) and dynamic faults (DFs). A March-element-based (MEB) compression scheme is proposed to reduce the volume of diagnostic data. The MEB compression scheme can efficiently compress the diagnostic data of a RAM tested by a March test for detecting SFs and DFs. Simulation results show that the compression ratio (the ratio of the number bits of the compressed diagnostic data to that of the original diagnostic data) is about 50.79% for an 8K × 16-bit memory. The area overhead of the BIST with the MEB compressor is about 2.73% for an 8K × 16-bit RAM using TSMC 0.18 μm cell library.

Original languageEnglish
Article number6923433
Pages (from-to)2020-2024
Number of pages5
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume33
Issue number12
DOIs
StatePublished - Dec 2014

Keywords

  • built-in self-test
  • compression
  • diagnosis
  • March test
  • Random access memory

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