A BIST scheme with the ability of diagnostic data compression for RAMs

Chih Sheng Hou; Jin Fu Li; Ting Jun Fu

doi:10.1109/TCAD.2014.2363393

A BIST scheme with the ability of diagnostic data compression for RAMs

Chih Sheng Hou, Jin Fu Li, Ting Jun Fu

Department of Electrical Engineering

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

This paper proposes a built-in self-test (BIST) scheme with syndrome-compression ability for random access memories (RAMs) with static (SF) and dynamic faults (DFs). A March-element-based (MEB) compression scheme is proposed to reduce the volume of diagnostic data. The MEB compression scheme can efficiently compress the diagnostic data of a RAM tested by a March test for detecting SFs and DFs. Simulation results show that the compression ratio (the ratio of the number bits of the compressed diagnostic data to that of the original diagnostic data) is about 50.79% for an 8K × 16-bit memory. The area overhead of the BIST with the MEB compressor is about 2.73% for an 8K × 16-bit RAM using TSMC 0.18 μm cell library.

Original language	English
Article number	6923433
Pages (from-to)	2020-2024
Number of pages	5
Journal	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume	33
Issue number	12
DOIs	https://doi.org/10.1109/TCAD.2014.2363393
State	Published - Dec 2014

Keywords

March test
Random access memory
built-in self-test
compression
diagnosis

Access to Document

10.1109/TCAD.2014.2363393

Cite this

@article{915b6ee60bfd47b8893164b058a8110d,

title = "A BIST scheme with the ability of diagnostic data compression for RAMs",

abstract = "This paper proposes a built-in self-test (BIST) scheme with syndrome-compression ability for random access memories (RAMs) with static (SF) and dynamic faults (DFs). A March-element-based (MEB) compression scheme is proposed to reduce the volume of diagnostic data. The MEB compression scheme can efficiently compress the diagnostic data of a RAM tested by a March test for detecting SFs and DFs. Simulation results show that the compression ratio (the ratio of the number bits of the compressed diagnostic data to that of the original diagnostic data) is about 50.79% for an 8K × 16-bit memory. The area overhead of the BIST with the MEB compressor is about 2.73% for an 8K × 16-bit RAM using TSMC 0.18 μm cell library.",

keywords = "March test, Random access memory, built-in self-test, compression, diagnosis",

author = "Hou, {Chih Sheng} and Li, {Jin Fu} and Fu, {Ting Jun}",

note = "Publisher Copyright: {\textcopyright} 2014 IEEE.",

year = "2014",

month = dec,

doi = "10.1109/TCAD.2014.2363393",

language = "???core.languages.en_GB???",

volume = "33",

pages = "2020--2024",

journal = "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",

issn = "0278-0070",

number = "12",

}

TY - JOUR

T1 - A BIST scheme with the ability of diagnostic data compression for RAMs

AU - Hou, Chih Sheng

AU - Li, Jin Fu

AU - Fu, Ting Jun

PY - 2014/12

Y1 - 2014/12

N2 - This paper proposes a built-in self-test (BIST) scheme with syndrome-compression ability for random access memories (RAMs) with static (SF) and dynamic faults (DFs). A March-element-based (MEB) compression scheme is proposed to reduce the volume of diagnostic data. The MEB compression scheme can efficiently compress the diagnostic data of a RAM tested by a March test for detecting SFs and DFs. Simulation results show that the compression ratio (the ratio of the number bits of the compressed diagnostic data to that of the original diagnostic data) is about 50.79% for an 8K × 16-bit memory. The area overhead of the BIST with the MEB compressor is about 2.73% for an 8K × 16-bit RAM using TSMC 0.18 μm cell library.

AB - This paper proposes a built-in self-test (BIST) scheme with syndrome-compression ability for random access memories (RAMs) with static (SF) and dynamic faults (DFs). A March-element-based (MEB) compression scheme is proposed to reduce the volume of diagnostic data. The MEB compression scheme can efficiently compress the diagnostic data of a RAM tested by a March test for detecting SFs and DFs. Simulation results show that the compression ratio (the ratio of the number bits of the compressed diagnostic data to that of the original diagnostic data) is about 50.79% for an 8K × 16-bit memory. The area overhead of the BIST with the MEB compressor is about 2.73% for an 8K × 16-bit RAM using TSMC 0.18 μm cell library.

KW - March test

KW - Random access memory

KW - built-in self-test

KW - compression

KW - diagnosis

UR - http://www.scopus.com/inward/record.url?scp=84913598752&partnerID=8YFLogxK

U2 - 10.1109/TCAD.2014.2363393

DO - 10.1109/TCAD.2014.2363393

M3 - 期刊論文

AN - SCOPUS:84913598752

SN - 0278-0070

VL - 33

SP - 2020

EP - 2024

JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

IS - 12

M1 - 6923433

ER -

A BIST scheme with the ability of diagnostic data compression for RAMs

Abstract

Keywords

Access to Document

Fingerprint

Cite this