A bayesian zero-failure reliability demonstrationtest of highquality electro-explosive devices

Tsai Hung Fan, Chia Chen Chang

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

Usually, for high reliability products the production cost is high and the lifetime is much longer, which may not be observable within a limited time. In this paper, an accelerated experiment is employed in which the lifetime follows an exponential distribution with the failure rate being related to the accelerated factor exponentially. The underlying parameters are also assumed to have the exponential prior distribu-tions. A Bayesian zero-failure reliability demonstration test is conducted to design forehand the minimum sample size and testing length subject to a certain specified reliability criterion. Probability of passing the test design as well as predictive prob-ability for additional experiments is also derived. Sensitivity analysis of the design is investigated by a simulation study.

Original languageEnglish
Pages (from-to)913-920
Number of pages8
JournalQuality and Reliability Engineering International
Volume25
Issue number8
DOIs
StatePublished - Dec 2009

Keywords

  • Accelerated experiment
  • Bayesian reliability demonstration test
  • Minimum sample size and testing length
  • Zero-failure reliability

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