A Bayesian Predictive Analysis of Step-Stress Accelerated Tests in Gamma Degradation-Based Processes

Tsai Hung Fan, Cian Huei Chen

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

Degradation modeling might be an alternative to the conventional life test in reliability assessment for high quality products. This paper develops a Bayesian approach to the step-stress accelerated degradation test. Reliability inference of the population is made based on the posterior distribution of the underlying parameters with the aid of Markov chain Monte Carlo method. Further sequential reliability inference on individual product under normal condition is also proposed. Simulation study and an illustrative example are presented to show the appropriateness of the proposed method.

Original languageEnglish
Pages (from-to)1417-1424
Number of pages8
JournalQuality and Reliability Engineering International
Volume33
Issue number7
DOIs
StatePublished - Nov 2017

Keywords

  • Bayesian reliability inference
  • gamma process
  • MCMC
  • step-stress accelerated degradation test

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