1.3 to 1.5 μm range emission from InAs/GaAs quantum dots grown by metalorganic chemical vapor deposition

T. P. Hsieh, N. T. Yeh, P. C. Chiu, K. F. Huang, W. C. Ho, M. C. Wu, J. I. Chyi

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations

Abstract

In this paper, we demonstrated the long wavelength light emission from InAs quantum dots (QDs) directly capped with GaAs or covered with InGaAs strain reducing layer (SRL) grown by metalorganic chemical vapor deposition (MOCVD). These long wavelength QDs are grown by interrupted growth method with AsH3 as V group precursors. 1.3 μm light emission is observed as the QD directly capped with GaAs. By inserting 6 nm In0.25Ga0.75As, longer emission wavelength of 1.49 μm is observed for the InAs quantum dots.

Original languageEnglish
Pages (from-to)456-459
Number of pages4
JournalConference Proceedings - International Conference on Indium Phosphide and Related Materials
StatePublished - 2003
Event2003 International Conference Indium Phosphide and Related Materials - Santa Barbara, CA, United States
Duration: 12 May 200316 May 2003

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