Engineering & Materials Science
Atomic force microscopy
27%
Capacitance measurement
31%
Charge injection
62%
Charge transfer
27%
Crystallinity
26%
Crystallites
30%
Electronic properties
100%
Electronic states
34%
Film thickness
69%
Metals
13%
Organic field effect transistors
36%
Semiconductor diodes
36%
Structural properties
70%
Temperature
8%
Temperature distribution
17%
Thin films
20%
Threshold voltage
47%
Transistors
55%
Voltage measurement
27%
X ray absorption
37%
X ray diffraction
21%
Physics & Astronomy
atomic force microscopy
12%
capacitance
12%
continuity
16%
crystallinity
14%
crystallites
14%
diffraction
8%
electrical measurement
15%
electronics
33%
field effect transistors
12%
film thickness
52%
fine structure
13%
injection
23%
MIS (semiconductors)
18%
performance
7%
rods
13%
room temperature
8%
semiconductor diodes
20%
temperature distribution
13%
thin films
8%
threshold voltage
30%
transistors
51%
trends
12%
x rays
14%
Chemical Compounds
Ambient Reaction Temperature
7%
Atomic Force Microscopy
10%
Charge Transfer
9%
Compound Mobility
9%
Crystallinity
9%
Crystallite
10%
Electronic Property
53%
Electronic State
9%
Field Effect
25%
Liquid Film
31%
Near Edge X-Ray Absorption Fine Structure
18%
Rod Like Crystal
12%
Voltage
18%
X-Ray Diffraction
6%