Effects of Deformation Rates on the Quality of Anodized Aa7005-T5 and Aa7075-T5 Alloy

This study prepares AA7005-T5 and 7075-T5 aluminum alloys plates. Theseplates subject to different strain levels via different degrees of cold-rolled, andsubsequently doing natural aging to obtain samples. Effect of microstructure onthe anodizing quality of cold-deformed plates will be observed. Most researchershave studied and discussed on processing parameters (volt, current, temperature andsolution of anodizing process) that affect quality of oxide films on the T6 or T73treated AA7XXX samples; including pore size, pore density, AAO film thicknessand so on. We simulate the industry process that commonly used to make the casesof lap-top or cell phone and are focusing on hot-work materials (T5) to observe theirmicrostructure change due to different strain levels on quality of anodizedaluminum oxide films.This study uses TEM、SEM to observe the migration of High-angle-boundaryand Low-angle-boundary under different levels of strain and also measures Vickshardness of deformed samples. During anodization, the relation of volt-time will berecorded and use of these data to analyze the energy that consumed at differentstages of anodize (stage I~ stage IV), which strongly affects pore size andcolor/brightness (L*a*b) of AAO film. The results of this study provides valuableinformation for industry for making high quality anodization on the high strengthaluminum alloys.