Effect of LED Die-Attachment on Stress in GaN Eip-Layers and Anelastic Behavior(1/3)

劉, 正毓 (PI)

Department of Chemical and Materials Engineering

1 Article

1 results

2016
Experimental Observation and Computer Simulation of Al/Sn Substitution in p-Type Aluminum Nitride-Doped Tin Oxide Thin Film
Lee, P. M., Liu, Y. S., Villamagua, L., Stashans, A., Carini, M. & Liu, C. Y., 3 Mar 2016, In: Journal of Physical Chemistry C. 120, 8, p. 4211-4218 8 p.
Research output: Contribution to journal › Article › peer-review
33 Scopus citations