Development of Total-Internal-Reflection and Wavelength-Modulated Polarization Interferometry for Measurement of Refractive Index and Thickness.

Project Details

StatusFinished
Effective start/end date1/08/19 → 31/07/20
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Keywords

  • Injection molding
  • Refractive index
  • Thickness
  • Total internal reflection
  • Diffractive optical element
  • Maximum phase difference
  • Wavelength modulation
  • Polarization interferometry