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2x-thru校正法之關鍵技術研發(3/3)
Chou, Chiu-Chih
(PI)
Department of Electrical Engineering
Overview
Fingerprint
Research output
(1)
Project Details
Status
Not started
Effective start/end date
1/08/26
→
31/07/27
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Fingerprint
Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.
Conductor Loss
Keyphrases
100%
Reference Impedance
Keyphrases
100%
De-embedding
Keyphrases
100%
2x-Thru
Keyphrases
100%
Time-Domain Reflectometry
Engineering
100%
Time Domain Reflectometry
Computer Science
100%
Electric Lines
Engineering
50%
Characteristic Impedance
Engineering
50%
Research output
Research output per year
2024
2024
2024
1
Article
Research output per year
Research output per year
Estimation of Reference Impedance in 2x-thru De-embedding With High Conductor-Loss Lines
Chou, C. C.
,
2024
,
In:
IEEE Transactions on Electromagnetic Compatibility.
66
,
5
,
p. 1315-1328
14 p.
Research output
:
Contribution to journal
›
Article
›
peer-review
Reference Impedance
100%
Conductor Loss
100%
2x-Thru
100%
De-embedding
100%
Time-Domain Reflectometry
100%