Research output per year
Research output per year
Project Details
| Status | Not started |
|---|---|
| Effective start/end date | 1/08/25 → 31/07/26 |
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Research output
- 3 Conference contribution
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Fault-Aware ECC Scheme for Enhancing the Read Reliability of STT-MRAMs
Wu, M. S., Chua, Y. L., Li, J. F., Chuan, Y. T. & Huang, S. H., 2023, Proceedings - 7th IEEE International Test Conference in Asia, ITC-Asia 2023. Institute of Electrical and Electronics Engineers Inc., (Proceedings - 7th IEEE International Test Conference in Asia, ITC-Asia 2023).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1 Scopus citations -
Hardware Trojans of Computing-In-Memories: Issues and Methods
Huang, S. H., Cheng, W. C. & Li, J. F., 2023, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. Cassano, L., Psarakis, M., Traiola, M. & Bosio, A. (eds.). Institute of Electrical and Electronics Engineers Inc., (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability
Li, J. F., 2023, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. Cassano, L., Psarakis, M., Traiola, M. & Bosio, A. (eds.). Institute of Electrical and Electronics Engineers Inc., (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review