Research output per year
Research output per year
Project Details
Description
Computing-in-memory (CIM) has been considered as an effective approach tocope with the data movement bottleneck of von-Neumann architecture, especiallyfor the application of deep neural network computation. The grand projectattempts to develop an integrated methodology including architecture-level,algorithm-level, and circuit-level techniques to enhance the reliability of CIMs.The techniques include reliability-aware CIM architecture, testing, fault-toleranceand approximation, and aging detection and mitigation techniques, which can beused to enhance the production yield and reliability of CIMs.
| Status | Finished |
|---|---|
| Effective start/end date | 1/08/22 → 31/07/23 |
UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This project contributes towards the following SDG(s):
Keywords
- Computing-In-Memory
- artificial intelligence
- fault-tolerance
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Research output
- 4 Conference contribution
-
An On-Line Aging Detection and Tolerance Framework for Improving Reliability of STT-MRAMs
Chen, Y. G., Huang, P. Y. & Li, J. F., 16 Jan 2023, ASP-DAC 2023 - 28th Asia and South Pacific Design Automation Conference, Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 13-18 6 p. (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1 Scopus citations -
DFT-Enhanced Test Scheme for Spin-Transfer-Torque (STT) MRAMs
Pan, Z. W. & Li, J. F., 2022, Proceedings - 2022 IEEE International Test Conference, ITC 2022. Institute of Electrical and Electronics Engineers Inc., p. 489-493 5 p. (Proceedings - International Test Conference; vol. 2022-September).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2 Scopus citations -
Fault Modeling and Testing of RRAM-based Computing-In Memories
Yang, Y. C. & Li, J. F., 2022, Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022. Institute of Electrical and Electronics Engineers Inc., p. 7-12 6 p. (Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
7 Scopus citations