Projects per year
Personal profile
Research Expertise
Semiconductor high-dielectric materials, emerging semiconductor material computing, silicon-based quantum computer component simulation
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Dive into the research topics where Ying-Tsang Tang is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
Projects
- 2 Finished
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Enabling the wide memory window and long endurance in hafnia-based FeFET from the perspective of interfacial layer
Tsai, Y. T., Chen, Y. T., Liu, C. R., Wang, S. M., Chen, Z. K., Pai, C. S., Huang, Z. R. & Tang, Y. T., 29 Feb 2024, In: Japanese Journal of Applied Physics. 63, 2, 028004.Research output: Contribution to journal › Comment/debate
Open Access -
Improvement of memory storage capacity and prolongation of endurance/retention through H2 plasma treatment of IGZO/HZO structure
Liu, C. R., Tsai, Y. T., Chen, Y. T., Chen, Z. K., Huang, Z. R., Wang, S. M., Pai, C. S. & Tang, Y. T., 28 Aug 2024, In: Journal of Applied Physics. 136, 8, 084102.Research output: Contribution to journal › Article › peer-review
Open Access2 Scopus citations -
Study of Spacing-induced Fringing Effects on Emerging CFET Technology Nodes
Chen, Y. Z., Thoti, N. & Tang, Y. T., 2024, 2024 IEEE Silicon Nanoelectronics Workshop, SNW 2024. Institute of Electrical and Electronics Engineers Inc., p. 103-104 2 p. (2024 IEEE Silicon Nanoelectronics Workshop, SNW 2024).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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The Simulation of Double Germanium Quantum Dots in a Ring-Shaped Quantum Structure
Liang, C. E. & Tang, Y. T., 2024, 2024 IEEE Silicon Nanoelectronics Workshop, SNW 2024. Institute of Electrical and Electronics Engineers Inc., p. 75-76 2 p. (2024 IEEE Silicon Nanoelectronics Workshop, SNW 2024).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Tunable defect engineering of Mo/TiON electrode in angstrom-laminated HfO2/ZrO2 ferroelectric capacitors towards long endurance and high temperature retention
Wang, S. M., Liu, C. R., Chen, Y. T., Lee, S. C. & Tang, Y. T., 13 May 2024, In: Nanotechnology. 35, 20, 205704.Research output: Contribution to journal › Article › peer-review
Open Access3 Scopus citations
Datasets
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Supplement
Liu, C.-R. (Creator), Tsai, Y.-T. (Creator), Chen, Y.-T. (Creator), Chen, Z.-K. (Creator), Huang, Z.-R. (Creator), Wang, S.-M. (Creator), Pai, C.-S. (Creator) & Tang, Y. (Creator), AIP Publishing, 2024
DOI: 10.60893/figshare.jap.26412742, https://aip.figshare.com/articles/figure/Supplement/26412742
Dataset
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Supplement
Liu, C.-R. (Creator), Tsai, Y.-T. (Creator), Chen, Y.-T. (Creator), Chen, Z.-K. (Creator), Huang, Z.-R. (Creator), Wang, S.-M. (Creator), Pai, C.-S. (Creator) & Tang, Y. (Creator), AIP Publishing, 2024
DOI: 10.60893/figshare.jap.26412742.v1, https://aip.figshare.com/articles/figure/Supplement/26412742/1
Dataset