Projects per year
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Research Expertise
Semiconductor high-dielectric materials, emerging semiconductor material computing, silicon-based quantum computer component simulation
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Dive into the research topics where Ying-Tsang Tang is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Deep insights into Interface Effects to achieve Low-voltage Operation (<1.2V), Low Process Temperature, and First-Principle Calculation
Tang, Y. T., Wu, T. M., Fan, C. L., Lai, Y. M., Hsiang, K. Y., Liao, C. Y., Chang, S. H., Yu, T. Y., Su, P., Chang, M. T., Huang, B. H., Hu, C., Chang, S. J., Chang, M. F. & Lee, M. H., 25 Aug 2021, 2021 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2021. Institute of Electrical and Electronics Engineers Inc., (2021 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2021).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Visualizing Ferroelectric Uniformity of Hf1- xZr xO2Films Using X-ray Mapping
Chang, S. J., Teng, C. Y., Lin, Y. J., Wu, T. M., Lee, M. H., Lin, B. H., Tang, M. T., Wu, T. S., Hu, C., Tang, E. Y. T. & Tseng, Y. C., 23 Jun 2021, In: ACS Applied Materials and Interfaces. 13, 24, p. 29212-29221 10 p.Research output: Contribution to journal › Article › peer-review
2 Scopus citations -
Pulse-Mediated Electronic Tuning of the MoS2-Perovskite Ferroelectric Field Effect Transistors
Chen, K. W., Chang, S. J., Tang, E. Y. T., Lin, C. P., Hou, T. H., Chen, C. H. & Tseng, Y. C., 22 Dec 2020, In: ACS Applied Electronic Materials. 2, 12, p. 3843-3852 10 p.Research output: Contribution to journal › Article › peer-review
1 Scopus citations -
3D Scalable, Wake-up Free, and Highly Reliable FRAM Technology with Stress-Engineered HfZrOx
Lin, Y. D., Tang, Y. T., Sheu, S. S., Hou, T. H., Lo, W. C., Lee, M. H., Chang, M. F., King, Y. C., Lin, C. J., Lee, H. Y., Yeh, P. C., Yang, H. Y., Yeh, P. S., Wang, C. Y., Su, J. W. & Li, S. H., Dec 2019, 2019 IEEE International Electron Devices Meeting, IEDM 2019. Institute of Electrical and Electronics Engineers Inc., 8993504. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2019-December).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
7 Scopus citations -
A Comprehensive Kinetical Modeling of Polymorphic Phase Distribution of Ferroelectric-Dielectrics and Interfacial Energy Effects on Negative Capacitance FETs
Tang, Y. T., Fan, C. L., Kao, Y. C., Modolo, N., Su, C. J., Wu, T. L., Kao, K. H., Wu, P. J., Hsaio, S. W., Useinov, A., Su, P., Wu, W. F., Huang, G. W., Shieh, J. M., Yeh, W. K. & Wang, Y. H., Jun 2019, 2019 Symposium on VLSI Technology, VLSI Technology 2019 - Digest of Technical Papers. Institute of Electrical and Electronics Engineers Inc., p. T222-T223 8776508. (Digest of Technical Papers - Symposium on VLSI Technology; vol. 2019-June).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
7 Scopus citations