Calculated based on number of publications stored in Pure and citations from Scopus
1988 …2022

Research activity per year

If you made any changes in Pure these will be visible here soon.
Filter
Conference contribution

Search results

  • 2021

    Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering

    Li, K. S. M., Li-Yang Chen, L., Cheng, K. C. C., Yi-Yu Liao, P., Wang, S. J., Huang, A. Y. A., Tsai, N., Chou, L., Han, G. C. H., Chen, J. E., Liang, H. C. & Hsu, C. L., 24 May 2021, Proceedings - 2021 IEEE European Test Symposium, ETS 2021. Institute of Electrical and Electronics Engineers Inc., 9465457. (Proceedings of the European Test Workshop; vol. 2021-May).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • Semi-Supervised Framework for Wafer Defect Pattern Recognition with Enhanced Labeling

    Chen, L. L. Y., Shu-Min Li, K., Jiang, X. H., Wang, S. J., Huang, A. Y. A., Chen, J. E., Liang, H. C. & Hsu, C. L., 2021, Proceedings - 2021 IEEE International Test Conference, ITC 2021. Institute of Electrical and Electronics Engineers Inc., p. 208-212 5 p. (Proceedings - International Test Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • 2020

    Innovative Practice on Wafer Test Innovations

    Hu, D. C., Hashimoto, H., Tseng, L. F., Cheng, K. C. C., Shu-Min Li, K., Wang, S. J., Chen, S. Y. S., Chen, J. E., Liu, C. & Huang, A., Apr 2020, Proceedings - 2020 IEEE 38th VLSI Test Symposium, VTS 2020. IEEE Computer Society, 9107619. (Proceedings of the IEEE VLSI Test Symposium; vol. 2020-April).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing

    Yeh, C. H. & Chen, J. E., Sep 2020, Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020. Institute of Electrical and Electronics Engineers Inc., p. 88-93 6 p. 9226565. (Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Scopus citations
  • Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis

    Cheng, K. C. C., Shu-Min Li, K., Huang, A. Y. A., Li, J. W., Chen, L. L. Y., Cheng-Yen Tsai, N., Wang, S. J., Lee, C. S., Chou, L., Liao, P. Y. Y., Liang, H. C. & Chen, J. E., Mar 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 1710-1711 2 p. 9116546. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • 2012

    A novel fractional discrete cosine transform based reversible watermarking for biomedical image applications

    Ko, L. T., Chen, J. E., Shieh, Y. S. & Sung, T. Y., 2012, Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012. p. 36-39 4 p. 6228242. (Proceedings - 2012 International Symposium on Computer, Consumer and Control, IS3C 2012).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    6 Scopus citations
  • Generic reliability analysis for safety-critical flexray drive-by-wire systems

    Leu, K. L., Chen, J. E., Wey, C. L. & Chen, Y. Y., 2012, Proceedings - 2012 International Conference on Connected Vehicles and Expo, ICCVE 2012. p. 216-221 6 p. 6519573. (Proceedings - 2012 International Conference on Connected Vehicles and Expo, ICCVE 2012).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    7 Scopus citations
  • 2011

    CMOS current-mode design of an S-shape correction curve generator

    Lin, K. J., Su, H. C., Cheng, C. J. & Chen, J. E., 2011, ISCE 2011 - 15th IEEE International Symposium on Consumer Electronics. p. 318-322 5 p. 5973840. (Proceedings of the International Symposium on Consumer Electronics, ISCE).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Yield-award placement optimization for Switched-Capacitor analog integrated circuits

    Huang, C. C., Chen, J. E., Luo, P. W. & Wey, C. L., 2011, Proceedings - IEEE International SOC Conference, SOCC 2011. p. 170-173 4 p. 6085127. (International System on Chip Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • 2010

    A verification flow for FlexRay communication robustness compliant with IEC 61508

    Leu, K. L., Chen, Y. Y., Wey, C. L. & Chen, J. E., 2010, ICIMA 2010 - 2010 2nd International Conference on Industrial Mechatronics and Automation. p. 228-231 4 p. 5538185. (ICIMA 2010 - 2010 2nd International Conference on Industrial Mechatronics and Automation; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • CMOS current-mode companding multiplier/divider and its Nth-root

    Lin, K. J., Cheng, C. J. & Chen, J. E., 2010, Proceedings of the 9th WSEAS International Conference on Instrumentation, Measurement, Circuits and Systems, IMCAS '10. p. 76-80 5 p. (Proceedings of the 9th WSEAS International Conference on Instrumentation, Measurement, Circuits and Systems, IMCAS '10).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Scopus citations
  • CMOS current-mode selectable S-shape correction circuit

    Lin, K. J., Cheng, C. J., Chiu, S. F. & Chen, J. E., 2010, Proceedings of the 9th WSEAS International Conference on Instrumentation, Measurement, Circuits and Systems, IMCAS '10. p. 70-75 6 p. (Proceedings of the 9th WSEAS International Conference on Instrumentation, Measurement, Circuits and Systems, IMCAS '10).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • Robustness analysis of the FlexRay system through fault tree analysis

    Leu, K. L., Chen, Y. Y., Wey, C. L. & Chen, J. E., 2010, Proceedings of 2010 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2010. p. 30-35 6 p. 5550952. (Proceedings of 2010 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • 2009

    Development of an emotional robot as a teaching assistant

    Chen, J. E., Yeh, L. T., Tseng, H. H., Wu, G. W. & Chung, I. H., 2009, Learning by Playing: Game-based Education System Design and Development - 4th International Conference on E-Learning and Games, Edutainment 2009, Proceedings. p. 518-523 6 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 5670 LNCS).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • Robustness investigation of the FlexRay system

    Leu, K. L., Wey, C. L., Chen, J. E. & Chen, Y. Y., 2009, Proceedings - 2009 IEEE International Symposium on Industrial Embedded Systems, SIES 2009. p. 148-151 4 p. 5196210. (Proceedings - 2009 IEEE International Symposium on Industrial Embedded Systems, SIES 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Scopus citations
  • Yield evaluation of analog placement with arbitrary capacitor ratio

    Chen, J. E., Luo, P. W. & Wey, C. L., 2009, Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009. p. 179-184 6 p. 4810290. (Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    10 Scopus citations
  • 2007

    A comparison of fault injection experiments under different verification environments

    Leu, K. L., Chen, Y. Y. & Chen, J. E., 2007, Fourth International Conference on Information Technology and Applications, ICITA 2007. p. 582-587 6 p. (Fourth International Conference on Information Technology and Applications, ICITA 2007).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Scopus citations
  • 2006

    A multilayer data copy scheme for low cost test with controlled scan-in power for multiple scan chain designs

    Lin, S. P., Lee, C. L., Chen, J. E., Chen, J. J., Luo, K. L. & Wu, W. C., 2006, 2006 IEEE International Test Conference, ITC. Institute of Electrical and Electronics Engineers Inc., 4079341. (Proceedings - International Test Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    5 Scopus citations
  • IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults

    Li, K. S. M., Chang, Y. W., Su, C., Lee, C. L. & Chen, J. E., 2006, Proceedings of the ASP-DAC 2006: Asia and South Pacific Design Automation Conference 2006. Institute of Electrical and Electronics Engineers Inc., p. 366-371 6 p. 1594710. (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC; vol. 2006).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 2005

    A cocktail approach on random access scan toward low power and high efficiency test

    Lin, S. P., Lee, C. L. & Chen, J. E., 2005, Proceedings of theICCAD-2005: International Conference on Computer-Aided Design. p. 94-99 6 p. 1560046. (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD; vol. 2005).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    7 Scopus citations
  • Adaptive encoding scheme for test volume/time reduction in SOC scan testing

    Lin, S. P., Lee, C. L. & Chen, J. E., 2005, Proceedings - 14th Asian Test Symposium, ATS 2005. p. 324-329 6 p. 1575450. (Proceedings of the Asian Test Symposium; vol. 2005).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • A scan matrix design for low power scan-based test

    Lin, S. P., Lee, C. L. & Chen, J. E., 2005, Proceedings - 14th Asian Test Symposium, ATS 2005. p. 224-229 6 p. 1575433. (Proceedings of the Asian Test Symposium; vol. 2005).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Educational robot - A case study for robot learning companion

    Hsu, S. H., Wang, J. H., Chang, B., Chen, J. E., Fan, K. C. & Chan, T. W., 2005, Proc. Int. Conf. on Computers in Education 2005: "Towards Sustainable and Scalable Educational Innovations Informed by the Learning Sciences"- Sharing Research Results and Exemplary Innovations, ICCE. p. 682-685 4 p. (Proc. Int. Conf. on Computers in Education 2005: "Towards Sustainable and Scalable Educational Innovations Informed by the Learning Sciences"- Sharing Research Results and Exemplary Innovations, ICCE).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • Finite state machine synthesis for at-speed oscillation testability

    Li, K. S. M., Lee, C. L., Jiang, T., Su, C. & Chen, J. E., 2005, Proceedings - 14th Asian Test Symposium, ATS 2005. p. 360-365 6 p. 1575456. (Proceedings of the Asian Test Symposium; vol. 2005).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Oscillation ring based interconnect test scheme for SOC

    Li, K. S. M., Lee, C. L., Su, C. & Chen, J. E., 2005, Proceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005. Institute of Electrical and Electronics Engineers Inc., p. 184-187 4 p. 1466154. (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    25 Scopus citations
  • 2002

    A testing scheme for crosstalk faults based on the oscillation test signal [VLSI]

    Wu, M. S., Lee, C. L., Chang, C. P. & Chen, J. E., 2002, Proceedings of the 11th Asian Test Symposium, ATS 2002. IEEE Computer Society, p. 170-175 6 p. 1181706. (Proceedings of the Asian Test Symposium; vol. 2002-January).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    5 Scopus citations
  • 1999

    A DFT for semi-DC fault diagnosis for switched-capacitor circuits

    Kuo, S. J., Lee, C. L., Chang, S. J. & Chen, J. E., 1999, Proceedings - European Test Workshop 1999, ETW 1999. Institute of Electrical and Electronics Engineers Inc., p. 58-63 6 p. 804228. (Proceedings - European Test Workshop 1999, ETW 1999).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • 1998

    A new IDDQ testing scheme employing charge storage BICS circuit for deep submicron CMOS ULSI

    Lu, C. W., Lee, C. L., Chen, J. E. & Su, C., 1998, Proceeding - 1998 IEEE International Workshop on IDDQ Testing, IDDQ 1998. Menon, S. M. & Malaiya, Y. K. (eds.). Institute of Electrical and Electronics Engineers Inc., 730757. (Proceeding - 1998 IEEE International Workshop on IDDQ Testing, IDDQ 1998; vol. 1998-November).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • 1996

    A fast and sensitive built-in current sensor for IDDQ testing

    Lu, C. W., Lee, C. L. & Chen, J. E., 1996, Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996. Tong, C. & Jayasuniana, A. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 56-58 3 p. 557816. (Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    17 Scopus citations
  • 1994

    Algebraic division for multilevel logic synthesis of multi-valued logic circuits

    Wang, H. M., Lee, C. L. & Chen, J. E., 1994, Proceedings of The International Symposium on Multiple-Valued Logic. Publ by IEEE, p. 44-51 8 p. (Proceedings of The International Symposium on Multiple-Valued Logic).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    7 Scopus citations
  • Complete test set for multiple-valued logic networks

    Wang, H. M., Lee, C. L. & Chen, J. E., 1994, Proceedings of The International Symposium on Multiple-Valued Logic. Publ by IEEE, p. 289-296 8 p. (Proceedings of The International Symposium on Multiple-Valued Logic).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Distributed fault simulation for sequential circuits by pattern partitioning

    Wu, W. C., Lee, C. L., Chen, J. E. & Lin, W. Y., 1994, Proceedings of the European Design and Test Conference. Anon (ed.). Publ by IEEE, p. 661 1 p. (Proceedings of the European Design and Test Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • TRANS: A fast and memory-efficient path delay fault simulator

    Lin, M. C., Chen, J. E. & Lee, C. L., 1994, Proceedings of the European Design and Test Conference. Anon (ed.). Publ by IEEE, p. 508-512 5 p. (Proceedings of the European Design and Test Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • 1993

    A two-phase fault simulation scheme for sequential circuits

    Wu, W. C., Lee, C. L. & Chen, J. E., 1993, ATS 1993 Proceedings - 2nd Asian Test Symposium. IEEE Computer Society, p. 60-65 6 p. 398780. (Proceedings of the Asian Test Symposium).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 1992

    Fault analysis on two-level (K + 1)-valued logic circuits

    Wang, H. M., Lee, C. L. & Chen, J. E., May 1992, Proceedings of The International Symposium on Multiple-Valued Logic. Publ by IEEE, p. 181-188 8 p. (Proceedings of The International Symposium on Multiple-Valued Logic).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 1990

    Single-fault fault collapsing analysis in sequential logic circuits

    Chen, J. E., Lee, C. L. & Shen, W. Z., Sep 1990, Digest of Papers - International Test Conference. Publ by IEEE, p. 809-814 6 p. (Digest of Papers - International Test Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • 1988

    SLOPE: A test pattern generator based on stop line oriented path end algorithm

    Chuang, S. J., Lee, C. L., Shen, W. Z., Jen, C. W., Chen, J. E., Jing, S. C. & Chen, M. D., 1988, Proceedings - IEEE International Symposium on Circuits and Systems. Publ by IEEE, p. 437-439 3 p. (Proceedings - IEEE International Symposium on Circuits and Systems; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations