Projects per year
Projects
- 5 Finished
Search results
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Finished
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An Academic Exploration on Interpreting the Yield and Randomness for Wafer Map Analysis
1/08/20 → 31/07/21
Project: Research
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Identification of the Nonrandom Defects in Volume Production Wafer Maps
1/08/18 → 31/07/19
Project: Research
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Identification of the Defect Uniformity in Volume Production Wafer Maps – Part Ii: Sun Burst on the Scene
1/08/17 → 31/07/18
Project: Research
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Identification of the Defect Uniformity in Volume Production Wafer Maps– Part I: Prior to Dawning
1/08/16 → 31/07/17
Project: Research