Projects per year
Personal profile
Research Expertise
VLSI Testing/VLSI CAD
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Dive into the research topics where Jwu-E Chen is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
Projects
- 5 Finished
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An Academic Exploration on Interpreting the Yield and Randomness for Wafer Map Analysis
1/08/20 → 31/07/21
Project: Research
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Identification of the Nonrandom Defects in Volume Production Wafer Maps
1/08/18 → 31/07/19
Project: Research
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Identification of the Defect Uniformity in Volume Production Wafer Maps – Part Ii: Sun Burst on the Scene
1/08/17 → 31/07/18
Project: Research
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Identification of the Defect Uniformity in Volume Production Wafer Maps– Part I: Prior to Dawning
1/08/16 → 31/07/17
Project: Research
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Multiple Retest Systems for Screening High-Quality Chips
Yeh, C. H. & Chen, J. E., Apr 2023, In: Journal of Electronic Testing: Theory and Applications (JETTA). 39, 2, p. 207-225 19 p.Research output: Contribution to journal › Article › peer-review
Open Access1 Scopus citations -
Prediction of the Test Yield of Future Integrated Circuits Through the Deductive Estimation Method
Yeh, C. H. & Chen, J. E., 1 Aug 2023, In: Journal of Circuits, Systems and Computers. 32, 12, 2350202.Research output: Contribution to journal › Article › peer-review
1 Scopus citations -
Recycling Test Methods to Improve Test Capacity and Increase Chip Shipments
Yeh, C. H. & Chen, J. E., 1 Jun 2023, In: IEEE Design and Test. 40, 3, p. 45-52 8 p.Research output: Contribution to journal › Article › peer-review
2 Scopus citations -
Application of Three-Repetition Tests Scheme to Improve Integrated Circuits Test Quality to Near-Zero Defect
Yeh, C. H. & Chen, J. E., 1 Jun 2022, In: Sensors (Switzerland). 22, 11, 4158.Research output: Contribution to journal › Article › peer-review
Open Access2 Scopus citations -
Using Enhanced Test Systems Based on Digital IC Test Model for the Improvement of Test Yield
Yeh, C. H., Chen, J. E., Chang, C. J. & Huang, T. C., 1 Apr 2022, In: Electronics (Switzerland). 11, 7, 1115.Research output: Contribution to journal › Article › peer-review
Open Access2 Scopus citations