Projects per year
Personal profile
Research Expertise
VLSI Testing/VLSI CAD
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Dive into the research topics where Jwu-E Chen is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Projects
- 6 Finished
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An Academic Exploration on Interpreting the Yield and Randomness for Wafer Map Analysis
1/08/20 → 31/07/21
Project: Research
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Identification of the Nonrandom Defects in Volume Production Wafer Maps
1/08/18 → 31/07/19
Project: Research
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Identification of the Defect Uniformity in Volume Production Wafer Maps – Part Ii: Sun Burst on the Scene
1/08/17 → 31/07/18
Project: Research
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Application of Three-Repetition Tests Scheme to Improve Integrated Circuits Test Quality to Near-Zero Defect
Yeh, C. H. & Chen, J. E., 1 Jun 2022, In: Sensors (Switzerland). 22, 11, 4158.Research output: Contribution to journal › Article › peer-review
Open Access -
Using Enhanced Test Systems Based on Digital IC Test Model for the Improvement of Test Yield
Yeh, C. H., Chen, J. E., Chang, C. J. & Huang, T. C., 1 Apr 2022, In: Electronics (Switzerland). 11, 7, 1115.Research output: Contribution to journal › Article › peer-review
Open Access1 Scopus citations -
Wafer Defect Pattern Labeling and Recognition Using Semi-Supervised Learning
Li, K. S. M., Jiang, X. H., Chen, L. L. Y., Wang, S. J., Huang, A. Y. A., Chen, J. E., Liang, H. C. & Hsu, C. L., 1 May 2022, In: IEEE Transactions on Semiconductor Manufacturing. 35, 2, p. 291-299 9 p.Research output: Contribution to journal › Article › peer-review
1 Scopus citations -
Wafer Scratch Pattern Reconstruction for High Diagnosis Accuracy and Yield Optimization
Li, K. S. M., Chen, L. L. Y., Liao, P. Y. Y., Wang, S. J., Huang, A. Y. A., Chou, L., Tsai, N. C. Y., Cheng, K. C. C., Han, G. C. H., Lee, C. S., E Chen, J., Liang, H. T. & Hsu, C. L., 2022, (Accepted/In press) In: IEEE Transactions on Semiconductor Manufacturing.Research output: Contribution to journal › Article › peer-review
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Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering
Li, K. S. M., Li-Yang Chen, L., Cheng, K. C. C., Yi-Yu Liao, P., Wang, S. J., Huang, A. Y. A., Tsai, N., Chou, L., Han, G. C. H., Chen, J. E., Liang, H. C. & Hsu, C. L., 24 May 2021, Proceedings - 2021 IEEE European Test Symposium, ETS 2021. Institute of Electrical and Electronics Engineers Inc., 9465457. (Proceedings of the European Test Workshop; vol. 2021-May).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review