Projects per year
Personal profile
Research Expertise
VLSI Testing/VLSI CAD
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Dive into the research topics where Jwu-E Chen is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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An Academic Exploration on Interpreting the Yield and Randomness for Wafer Map Analysis
1/08/20 → 31/07/21
Project: Research
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Identification of the Nonrandom Defects in Volume Production Wafer Maps
1/08/18 → 31/07/19
Project: Research
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Identification of the Defect Uniformity in Volume Production Wafer Maps – Part Ii: Sun Burst on the Scene
1/08/17 → 31/07/18
Project: Research
Research output
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Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering
Li, K. S. M., Li-Yang Chen, L., Cheng, K. C. C., Yi-Yu Liao, P., Wang, S. J., Huang, A. Y. A., Tsai, N., Chou, L., Han, G. C. H., Chen, J. E., Liang, H. C. & Hsu, C. L., 24 May 2021, Proceedings - 2021 IEEE European Test Symposium, ETS 2021. Institute of Electrical and Electronics Engineers Inc., 9465457. (Proceedings of the European Test Workshop; vol. 2021-May).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Hidden Wafer Scratch Defects Projection for Diagnosis and Quality Enhancement
Li, K. S. M., Liao, P. Y. Y., Cheng, K. C. C., Chen, L. L. Y., Wang, S. J., Huang, A. Y. A., Chou, L., Han, G. C. H., Chen, J. E., Liang, H. C. & Hsu, C. L., Feb 2021, In: IEEE Transactions on Semiconductor Manufacturing. 34, 1, p. 9-16 8 p., 9273073.Research output: Contribution to journal › Article › peer-review
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Machine Learning-Based Detection Method for Wafer Test Induced Defects
Cheng, K. C. C., Chen, L. L. Y., Li, J. W., Li, K. S. M., Tsai, N. C. Y., Wang, S. J., Huang, A. Y. A., Chou, L., Lee, C. S., Chen, J. E., Liang, H. C. & Hsu, C. L., May 2021, In: IEEE Transactions on Semiconductor Manufacturing. 34, 2, p. 161-167 7 p., 9375473.Research output: Contribution to journal › Article › peer-review
3 Scopus citations -
Semi-Supervised Framework for Wafer Defect Pattern Recognition with Enhanced Labeling
Chen, L. L. Y., Shu-Min Li, K., Jiang, X. H., Wang, S. J., Huang, A. Y. A., Chen, J. E., Liang, H. C. & Hsu, C. L., 2021, Proceedings - 2021 IEEE International Test Conference, ITC 2021. Institute of Electrical and Electronics Engineers Inc., p. 208-212 5 p. (Proceedings - International Test Conference).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Unbalanced-tests to the improvement of yield and quality
Yeh, C. H. & Chen, J. E., 1 Dec 2021, In: Electronics (Switzerland). 10, 23, 3032.Research output: Contribution to journal › Article › peer-review
Open Access1 Scopus citations