Ju-Yi Lee

2022

3-dimensional displacements measurement with two-point source interference

Lee, J. Y., Lin, T. K. & Hsieh, H. L., 2022, Optics and Photonics for Advanced Dimensional Metrology II. de Groot, P. J., Leach, R. K. & Picart, P. (eds.). SPIE, 1213704. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 12137).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Development of a linear encoder based on common-optical-path design

Chen, P. C., Hsieh, H. L. & Lee, J. Y., 2022, Optics and Photonics for Advanced Dimensional Metrology II. de Groot, P. J., Leach, R. K. & Picart, P. (eds.). SPIE, 121370Q. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 12137).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2021

Analysis of Geometric Distortion for Stereo Vision System by VDI/VDE 2634 Guideline

Wu, Y. J., Ho, B. L., Lin, H. Y., Lee, J. Y. & Ou-Yang, M., 2021, 31st International Scientific Symposium Metrology and Metrology Assurance, MMA 2021. Institute of Electrical and Electronics Engineers Inc., (31st International Scientific Symposium Metrology and Metrology Assurance, MMA 2021).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Dynamic out-of-plane displacement measurement using the instantaneous analysis phase-shifting method

Yeh, H. Y., Hsu, Y. K., Wei, A. C. & Lee, J. Y., Mar 2021, In: Microsystem Technologies. 27, 3, p. 957-965 9 p.

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Dynamic range enhancement of the roll angle displacement measurement with birefringence using a polarization camera

Lee, J. Y., Sung, W. Y. & Hsu, C. T., 10 Oct 2021, In: Applied Optics. 60, 29, p. 9110-9116 7 p.

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Measurement of focal length and radius of curvature for spherical lenses and mirrors by using digital-grating moiré effect

Han, C. Y., Lo, W. T., Chen, K. H., Lee, J. Y., Yeh, C. H. & Chen, J. H., Jul 2021, In: Photonics. 8, 7, 252.

Research output: Contribution to journal › Article › peer-review

Open Access

2 Scopus citations

Measurement of the refractive index of lenses from the maximum phase difference of the total internal reflection with a polarization camera

Lee, J. Y., Chiang, C. Y., Sung, W. Y., Weng, T. Y., Chen, J. H. & Hsu, C. C., 1 Apr 2021, In: Applied Optics. 60, 10, p. B106-B112

Research output: Contribution to journal › Article › peer-review

Reusable enzymatic cuvette with heterodyne refractometer for in-vitro glucose concentration measurement

Hsu, C. C., Wu, M. R., Hung, S. H., Lee, J. Y., Wu, C. C. & Dai, C. L., 1 Sep 2021, In: Optical Engineering. 60, 9, 094101.

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

2020

Automatic and improved camera information processing for a 3D photo- modelling system

Wu, T. C., Lai, J. Y., Wang, D. W., Liao, C. Y. & Lee, J. Y., 2020, In: Computer-Aided Design and Applications. 17, 1, p. 124-137 14 p.

Research output: Contribution to journal › Article › peer-review

Open Access

Wavelength-modulated standing-wave interferometry for small out-of-plane displacement measurement

Lee, J. Y. & Hung, C. T., Apr 2020, In: Optics and Laser Technology. 124, 105967.

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

2019

Design modification of additive manufacturing parts using texture information of 3d model

Wu, T. C., Lai, J. Y., Tseng, Y. W., Liao, C. Y. & Lee, J. Y., 2019, Recent Development in Machining, Materials and Mechanical Technologies III. Nguyen, H. B. (ed.). Trans Tech Publications Ltd, p. 19-30 12 p. (Key Engineering Materials; vol. 825 KEM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Force-displacement measurement using simultaneous phase-shifting technique

Yeh, H. Y., Hsu, Y. K., Lee, J. Y. & Wei, A. C., 2019, In: Japanese Journal of Applied Physics. 58, SJ, SJJD02.

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Polarization-standing-wave interferometer for displacement measurement

Lee, J. Y. & Wang, Y. X., Apr 2019, In: Optics and Laser Technology. 111, p. 110-114 5 p.

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

V-groove and parabolic array for enlarging the acceptance angle of a side-absorption concentrated photovoltaic system

Wei, A. C., Hsiao, S. Y., Sze, J. R. & Lee, J. Y., 15 Apr 2019, In: Optics and Laser Technology. 112, p. 426-435 10 p.

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

2018

2-DOF in-Plane Displacement Measurement by Wollaston Prism-based Interferometer

Hsieh, H. L., Lee, J. Y., Sun, B. Y. & Fan, G. Y., 27 Aug 2018, 2018 14th IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications, MESA 2018. Institute of Electrical and Electronics Engineers Inc., 8449196. (2018 14th IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications, MESA 2018).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

A high-resolution texture mapping technique for 3D textured model

Lai, J. Y., Wu, T. C., Phothong, W., Wang, D. W., Liao, C. Y. & Lee, J. Y., 12 Nov 2018, In: Applied Sciences (Switzerland). 8, 11, 2228.

Research output: Contribution to journal › Article › peer-review

Open Access

12 Scopus citations

Editable texture map generation and optimization technique for 3D visualization presentation

Wu, T. C., Lai, J. Y., Phothong, W., Wang, D. W., Liao, C. Y. & Lee, J. Y., 4 May 2018, In: Computer-Aided Design and Applications. 15, 3, p. 378-389 12 p.

Research output: Contribution to journal › Article › peer-review

Open Access

3 Scopus citations

Improved process stability on an extremely thin amorphous/crystalline silicon interface passivation layer by using predeposition on the chamber wall

Hsieh, Y. L., Tseng, C. L., Lee, C. C., Fuh, Y. K., Chang, J. Y., Lee, J. Y. & Li, T. T., 2018, In: ECS Journal of Solid State Science and Technology. 7, 8, p. P355-P361

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

2017

Cost-Effective Light-Mixing Module for Solar-Lighting System Appended with Auxiliary RGBW Light-Emitting Diodes

Chi Wei, A., Chieh Lo, S., Lee, J. Y. & Yeh, H. Y., 1 Dec 2017, In: Journal of Solar Energy Engineering, Transactions of the ASME. 139, 6, 061006.

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Fast and accurate triangular model generation for the shape-from-silhouette technique

Phothong, W., Wu, T. C., Lai, J. Y., Wang, D. W., Liao, C. Y. & Lee, J. Y., 7 Jun 2017, In: Computer-Aided Design and Applications. 14, 4, p. 436-449 14 p.

Research output: Contribution to journal › Article › peer-review

Open Access

4 Scopus citations

Full-field wafer warpage measurement technique

Hsieh, H. L., Lee, J. Y., Huang, Y. G., Liang, A. J. & Sun, B. Y., 2017, Optical Measurement Systems for Industrial Inspection X. Lehmann, P., Goncalves, A. A. & Osten, W. (eds.). SPIE, 103293Z. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 10329).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Heterodyne grating interferometry based on sinusoidal phase modulation for displacement measurement

Lee, J. Y., Hsieh, H. L. & Lin, Z. Y., 2017, Optical Measurement Systems for Industrial Inspection X. Lehmann, P., Goncalves, A. A. & Osten, W. (eds.). SPIE, 103293S. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 10329).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Model for 3D printing created from multiview 2D silhouette images

Liao, C. Y., Ren, Y. L., Wang, D. W., Lai, J. Y. & Lee, J. Y., 13 Nov 2017.

Research output: Contribution to conference › Paper › peer-review

1 Scopus citations

Standing-wave interferometer based on single-layer SiO₂ nano-sphere scattering

Lee, J. Y., Wang, Y. X., Lin, Z. Y., Lin, C. R. & Chan, C. H., 30 Oct 2017, In: Optics Express. 25, 22, p. 26628-26637 10 p.

Research output: Contribution to journal › Article › peer-review

Open Access

6 Scopus citations

Structural and electrical investigations of a-Si:H(i) and a-Si:H(n+) stacked layers for improving the interface and passivation qualities

Hsieh, Y. L., Lee, C. C., Lu, C. C., Fuh, Y. K., Chang, J. Y., Lee, J. Y. & Li, T. T., 1 Jul 2017, In: Journal of Photonics for Energy. 7, 3, 035503.

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

2016

Angular Displacement Measurement by Surface Plasmon Resonance and Wavelength-Modulated Heterodyne Interferometry

Lee, J. Y. & Hsieh, H. L., 2016, Imaging Systems and Applications, IS 2016. Optica Publishing Group (formerly OSA), JW4A.9. (Optics InfoBase Conference Papers).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Compound parabolic concentrator design for red, green, blue, and white LED light mixing

Wei, A. C., Lo, S. C., Hung, P. F., Lee, J. Y., Yeh, H. Y., Huang, H. C. & Li, C. M., Aug 2016, In: Japanese Journal of Applied Physics. 55, 8, 08RF02.

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Compound parabolic concentrator design for RGBW LEDs light mixing

Wei, A. C., Lo, S. C., Hung, P. F., Lee, J. Y., Li, C. M., Huang, H. C. & Yeh, H. Y., 23 Feb 2016, MOC 2015 - Technical Digest of 20th Microoptics Conference. Institute of Electrical and Electronics Engineers Inc., 7416492. (MOC 2015 - Technical Digest of 20th Microoptics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Development of an angular displacement measurement technique through birefringence heterodyne interferometry

Hsieh, H. L., Lee, J. Y., Chen, L. Y. & Yang, Y., 4 Apr 2016, In: Optics Express. 24, 7, p. 6802-6813 12 p.

Research output: Contribution to journal › Article › peer-review

Open Access

16 Scopus citations

2015

Development of an angular displacement measurement by birefringence heterodyne interferometry

Chen, L. Y., Lee, J. Y., Chang, H. S. & Yang, Y., 2015, In: Smart Science. 3, 4, p. 188-192 5 p.

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Development of an Angular Displacement Measurement by Birefringence Heterodyne Interferometry

Chen, L. Y., Lee, J. Y., Chang, H. S. & Yang, Y., 2015, In: Smart Science. 3, 4, p. 188-192 5 p.

Research output: Contribution to journal › Article › peer-review

Thin-film growth rate monitor by normal-incidence reflectance

Huang, F. R., Chen, X. D., Wang, C. C. & Lee, J. Y., 2015, Recent Development in Machining, Materials and Mechanical Technologies. Chen, J-C., Hiroshi, U., Lee, S-W. & Fuh, Y-K. (eds.). Trans Tech Publications Ltd, p. 107-112 6 p. (Key Engineering Materials; vol. 656-657).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2014

Electrical and optical characterization of boron-doped microcrystalline SiH films prepared by ECR-CVD for solar cell

Hsieh, Y. L., Li, T. T., Hu, L. C., Chu, Y. H., Lee, C. C., Chang, J. Y., Chen, I. C., Lee, J. Y. & Wang, S. H., 2014, In: ECS Transactions. 60, 1, p. 557-563 7 p.

Research output: Contribution to journal › Article › peer-review

Wavelength-modulated heterodyne grating shearing interferometry for precise displacement measurement

Hsieh, H. L., Lee, J. Y. & Chung, Y. C., 1 Aug 2014, In: Advanced Optical Technologies. 3, 4, p. 395-400 6 p.

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

2013

Alternative displacement sensor with reflection type holographic grating

Ho, Y. Y., Lin, Z. R., Hsu, C. C., Wu, C. C. & Lee, J. Y., 2013, International Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013. 87693K. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 8769).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Displacement measurement using a wavelengthphase-shifting grating interferometer

Lee, J. Y. & Jiang, G. A., 21 Oct 2013, In: Optics Express. 21, 21, p. 25553-25564 12 p.

Research output: Contribution to journal › Article › peer-review

Open Access

37 Scopus citations

Enhanced sensitivity to surface plasmon resonance phase in wavelength-modulated heterodyne interferometry

Lee, J. Y., Mai, L. W., Hsu, C. C. & Sung, Y. Y., 15 Feb 2013, In: Optics Communications. 289, p. 28-32 5 p.

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Heterodyne common-path grating interferometer with Littrow configuration

Wu, C. C., Hsu, C. C., Lee, J. Y. & Chen, Y. Z., 3 Jun 2013, In: Optics Express. 21, 11, p. 13322-13332 11 p.

Research output: Contribution to journal › Article › peer-review

Open Access

17 Scopus citations

Littrow-type self-aligned laser encoder with high tolerance using double diffractions

Wu, C. C., Hsu, C. C., Lee, J. Y., Chen, Y. Z. & Yang, J. S., 15 Jun 2013, In: Optics Communications. 297, p. 89-97 9 p.

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Measurement of refractive index variation by differential surface plasmon resonance technique

Lee, J. Y. & Gu, W. S., Mar 2013, In: Optical Review. 20, 2, p. 182-184 3 p.

Research output: Contribution to journal › Article › peer-review

Optical emission spectroscopy studies in ECR plasma used for the deposition of silicon oxide film

Hsieh, Y. L., Chang, S. Y., Li, T. T., Hu, L. C., Lee, C. C., Chang, J. Y., Chen, I. C., Chu, Y. H., Lee, J. Y. & Wang, S. H., 2013, China Semiconductor Technology International Conference 2013, CSTIC 2013. 1 ed. p. 473-481 9 p. (ECS Transactions; vol. 52, no. 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

2012

A glucose sensor fabricated on glass substrate with glucose oxidase immobilized technique

Wu, T. C., Lin, T. Q., Hsu, C. C. & Lee, J. Y., 2012, 2012 Proceedings of SICE Annual Conference, SICE 2012. Society of Instrument and Control Engineers (SICE), p. 979-981 3 p. 6318583. (Proceedings of the SICE Annual Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Double corner cube method for enhancing the sensitivity of straightness measurement

Pan, T. S., Lee, J. Y., Wu, S. W., Hsieh, H. L. & Hsu, C. C., 2012, 2012 Proceedings of SICE Annual Conference, SICE 2012. Society of Instrument and Control Engineers (SICE), p. 1010-1013 4 p. 6318589. (Proceedings of the SICE Annual Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Experimental results of a wafer positioning system using machine vision after system calibration

Chen, Y. C., Chen, Y. P. & Lee, J. Y., 2012, 2012 Proceedings of SICE Annual Conference, SICE 2012. Society of Instrument and Control Engineers (SICE), p. 1014-1017 4 p. 6318590. (Proceedings of the SICE Annual Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

6 Scopus citations

Measurement of in-plane displacement by wavelength-modulated heterodyne speckle interferometry

Lee, J. Y., Lu, M. P., Lin, K. Y. & Huang, S. H., 10 Mar 2012, In: Applied Optics. 51, 8, p. 1095-1100 6 p.

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

2011

A novel method for real-time wafer positioning during transfer process

Chen, Y. C., Chen, Y. P. & Lee, J. Y., 2011, SICE 2011 - SICE Annual Conference 2011, Final Program and Abstracts. Society of Instrument and Control Engineers (SICE), p. 1933-1937 5 p. 6060284. (Proceedings of the SICE Annual Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

Common-path laser encoder for nanopositioning in long travel range

Wu, C. C., Hsu, C. C., Lee, J. Y. & Cheng, C. Y., 2011, SICE 2011 - SICE Annual Conference 2011, Final Program and Abstracts. Society of Instrument and Control Engineers (SICE), p. 817-820 4 p. 6060775. (Proceedings of the SICE Annual Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Common-path laser encoder system for nanopositioning

Wu, C. C., Hsu, C. C., Lee, J. Y. & Cheng, C. Y., 2011, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V. 81050I. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 8105).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Design and evaluation of a Blu-ray pickup head system for determining the tilt angle and displacement of the test plane

Sun, W. S., Tien, C. L., Chung, T. Y., Lin, Y. N., Lee, J. Y., Hsieh, D. Y. & Lin, T. W., Aug 2011, In: Optics and Lasers in Engineering. 49, 8, p. 1076-1088 13 p.

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Development of an auto-focus system based on the moiré method

Lee, J. Y., Wang, Y. H., Lai, L. J., Lin, Y. J. & Chang, Y. H., Dec 2011, In: Measurement: Journal of the International Measurement Confederation. 44, 10, p. 1793-1800 8 p.

Research output: Contribution to journal › Review article › peer-review

18 Scopus citations

Ju-Yi Lee

Research output

Search results