Projects per year
Personal profile
Research Expertise
Laser interferometry White light interferometry Optoelectronic technology and measurement Optoelectronic signal
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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Dive into the research topics where Ju-Yi Lee is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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Optimization of Polarization Component Optical Axis Alignment Technique
Lee, J.-Y. (PI)
1/05/23 → 30/04/24
Project: Research
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New Engineering Education Method Experiment & Construction
Lee, J.-Y. (PI)
1/04/23 → 31/01/25
Project: Research
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Development of an Automated Measurement System for Sapphire Glass Holes Based on Shape from Focus Method
Lin, Y. R., Chu, C. Y. & Lee, J. Y., 2025, 2025 IEEE International Conference on Consumer Electronics, ICCE 2025. Institute of Electrical and Electronics Engineers Inc., (Digest of Technical Papers - IEEE International Conference on Consumer Electronics).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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High sensitivity roll angle measurement based on birefringent polarization interferometry
Lee, J. Y., Chen, W. Y. & Chang, S. H., Nov 2025, In: Optics and Laser Technology. 189, 113052.Research output: Contribution to journal › Article › peer-review
1 Scopus citations -
One-shot polarization interferometry for measurement of surface profile
Tsai, H. H., Tsai, Y. J., Lee, J. Y. & Cao, T. H., May 2025, In: Measurement: Sensors. 38, 101827.Research output: Contribution to journal › Article › peer-review
Open Access3 Scopus citations -
Simultaneous measurement of roll and pitch angular displacements based on polarization interferometry
Lee, J. Y., Chang, S. H. & Chen, W. Y., Jan 2025, In: Measurement: Journal of the International Measurement Confederation. 242, 116270.Research output: Contribution to journal › Article › peer-review
4 Scopus citations -
Development of a full-field polarization interferometer for measurement of wafer surface profile
Tsai, Y. J., Tsai, H. H., Lee, J. Y. & Hsieh, H. L., 2023, Optical Measurement Systems for Industrial Inspection XIII. Lehmann, P. (ed.). SPIE, 1261835. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 12618).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review