Projects per year
Personal profile
Research Expertise
Laser interferometry White light interferometry Optoelectronic technology and measurement Optoelectronic signal
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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Collaborations and top research areas from the last five years
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New Engineering Education Method Experiment & Construction
Lee, J.-Y. (PI)
1/04/23 → 31/01/25
Project: Research
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Optimization of Polarization Component Optical Axis Alignment Technique
Lee, J.-Y. (PI)
1/05/23 → 30/04/24
Project: Research
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Development of a full-field polarization interferometer for measurement of wafer surface profile
Tsai, Y. J., Tsai, H. H., Lee, J. Y. & Hsieh, H. L., 2023, Optical Measurement Systems for Industrial Inspection XIII. Lehmann, P. (ed.). SPIE, 1261835. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 12618).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Dual beam polarization interferometry for roll angular displacement measurement
Lee, J. Y., Hsu, C. T., Chang, S. H. & Chen, W. Y., 30 Nov 2023, In: Measurement: Journal of the International Measurement Confederation. 222, 113571.Research output: Contribution to journal › Article › peer-review
2 Scopus citations -
3-dimensional displacements measurement with two-point source interference
Lee, J. Y., Lin, T. K. & Hsieh, H. L., 2022, Optics and Photonics for Advanced Dimensional Metrology II. de Groot, P. J., Leach, R. K. & Picart, P. (eds.). SPIE, 1213704. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 12137).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Development of a linear encoder based on common-optical-path design
Chen, P. C., Hsieh, H. L. & Lee, J. Y., 2022, Optics and Photonics for Advanced Dimensional Metrology II. de Groot, P. J., Leach, R. K. & Picart, P. (eds.). SPIE, 121370Q. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 12137).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Analysis of Geometric Distortion for Stereo Vision System by VDI/VDE 2634 Guideline
Wu, Y. J., Ho, B. L., Lin, H. Y., Lee, J. Y. & Ou-Yang, M., 2021, 31st International Scientific Symposium Metrology and Metrology Assurance, MMA 2021. Institute of Electrical and Electronics Engineers Inc., (31st International Scientific Symposium Metrology and Metrology Assurance, MMA 2021).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
3 Scopus citations