Keyphrases
Random Access Memory
100%
Built-in Self-repair
99%
Built-in-self-test (BiST)
89%
Repair Scheme
70%
Ternary Content Addressable Memory
60%
Redundancy
56%
System-on-chip
52%
Comparison Faults
51%
Content-addressable Memory
47%
Built-in Redundancy Analysis
44%
Testing Algorithm
43%
Embedded Memory
43%
Area Cost
42%
Three-dimensional (3D)
38%
Through Silicon via
36%
Three-Dimensional ICs
34%
Redundancy Analysis Algorithm
30%
Write Operation
30%
Yield Improvement
28%
In-memory Computing
28%
Repair Rate
28%
Area Overhead
27%
Analysis Scheme
26%
Dynamic Random Access Memory
25%
Static Random Access Memory
25%
March Test
22%
Test Circuit
21%
Repair Method
21%
Coupling Faults
20%
Error Correction Codes
20%
Diagnosis Scheme
20%
System-on-chip Design
20%
Testing Method
19%
Built-in Self-Diagnosis
19%
Fast Fourier Transform
19%
8T SRAM
19%
NAND Flash Memory
19%
Fault Test
19%
Asymmetric Cell
19%
Encoder
18%
Binary Content-addressable Memory
18%
3D IC
18%
Fault Model
18%
Diagnostic Algorithm
17%
Transform Network
17%
Memristor
17%
Reconfigurable
17%
Compression Techniques
16%
Local Bitmap
16%
Memory Cell
15%
Computer Science
Random Access Memory
97%
Redundancy Analysis
77%
System-on-Chip
65%
build-in self-test
64%
Experimental Result
55%
ternary content addressable memory
55%
Content-Addressable Memory
55%
embedded memory
49%
Test Algorithm
49%
Write Operation
35%
through silicon vias
30%
Time Complexity
23%
ternary content-addressable memory
23%
Yield Enhancement
22%
Compression Technique
20%
Static Random Access Memory
19%
Fast Fourier Transform
19%
Reconfiguration
19%
Multicore
18%
Computer Architecture
15%
Computer Aided Manufacturing
15%
Fault Tolerant
14%
Diagnosis Algorithm
14%
Input/Output
13%
Fault Location
12%
Hardware Overhead
12%
Flash Memory
12%
Integration Technology
12%
Error Correction Code
11%
Memory Multiple
11%
Dynamic Random Access Memory
10%
Memory Array
10%
Semiconductor Memory
10%
Computer Hardware
9%
Integrated Circuit Design
9%
Redundancy Level
9%
Data Retention
9%
Fault Diagnosis
9%
Test Methodology
9%
Analysis of Algorithm
9%
Code Compression
9%
Integrated Circuit
9%
Erase Operation
9%
Process Variation
8%
Emerging Technology
8%
fault-tolerance
8%
Networks on Chips
7%
Data Compression
7%
Compression Scheme
7%
System on a Chip
7%
Engineering
Reliability Availability and Maintainability (Reliability Engineering)
94%
Random Access Memory
92%
Built-in Self Test
82%
System-on-Chip
57%
Experimental Result
38%
Test Time
35%
Test Circuit
29%
Area Overhead
24%
Simulation Result
22%
Compression Technique
21%
Dynamic Random Access Memory
20%
Fast Fourier Transform
19%
Adders
16%
Computer Aided Manufacturing
15%
Technology Integration
15%
Hardware Overhead
14%
Flash Memory
14%
Integrated Circuit Design
12%
Resistive
12%
Test Method
12%
Faulty Cell
12%
Error Correction
11%
Erase Operation
11%
Fault Model
11%
Test Technique
11%
Data Retention
10%
Fault Diagnosis
10%
Compression Scheme
9%
Test Group
9%
High Performance Networking
9%
Data Diagnostics
9%
Crosstalk
9%
Reconfiguration
9%
Repair Design
8%
Three Dimensional Integrated Circuits
8%
Fits and Tolerances
8%
Test Data
8%
Production Volume
8%
Interconnects
7%
Integrated Circuit
7%
Final Yield
7%
Area Reduction
7%
Testability
7%
Compression Ratio
7%
Electric Network Analysis
7%
Reconfigurability
7%
Deep Neural Network
7%
Nanoscale
6%
Correction Code
6%
Process Variation
6%
