Projects per year
Personal profile
Research Expertise
Near-Data Processing, Internet of Things, Deep Learning
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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Dive into the research topics where Jin-Fu Li is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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Behavioral Model Compiler for Simulating Read Disturbances and Read/Write Errors in STT-MRAMs
Chuan, Y. T., Su, L. Y., Huang, S. H. & Li, J. F., 2025, 2025 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2025 - Proceedings of Technical Papers. Institute of Electrical and Electronics Engineers Inc., (2025 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2025 - Proceedings of Technical Papers).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Hardware Trojan Design With Low Overhead and High Destructiveness for STT-MRAM-Based CIMs
Cheng, W. C., Huang, S. H. & Li, J. F., 2025, In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 44, 9, p. 3260-3273 14 p.Research output: Contribution to journal › Article › peer-review
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Local Trimming Method for Enhancing the Read Reliability of STT-MRAMs
Lin, P. Y. & Li, J. F., 2025, Proceedings - 2025 IEEE European Test Symposium, ETS 2025. Institute of Electrical and Electronics Engineers Inc., (Proceedings of the European Test Workshop).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Efficient Built-In Self-Test Scheme for Inter-Die Interconnects of Chiplet-Based Chips
Huang, Y. C., Lin, P. Y., Li, J. F., Fu, H. S. & Lee, Y. P., 2024, Proceedings - 2024 IEEE International Test Conference, ITC 2024. Institute of Electrical and Electronics Engineers Inc., p. 149-156 8 p. (Proceedings - International Test Conference).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2 Scopus citations -
Parallel-Check Trimming Test Approach for Selecting the Reference Resistance of STT-MRAMs
Lin, P. Y. & Li, J. F., 2024, Proceedings - 2024 29th IEEE European Test Symposium, ETS 2024. Institute of Electrical and Electronics Engineers Inc., (Proceedings of the European Test Workshop).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1 Scopus citations