Projects per year
Personal profile
Research Expertise
Near-Data Processing, Internet of Things, Deep Learning
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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Collaborations and top research areas from the last five years
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Reconfigurable Deep Neural Network Techniques for Supervised Learning(3/3)
Li, J.-F. (PI)
1/08/21 → 31/07/22
Project: Research
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Parallel-Check Trimming Test Approach for Selecting the Reference Resistance of STT-MRAMs
Lin, P. Y. & Li, J. F., 2024, Proceedings - 2024 29th IEEE European Test Symposium, ETS 2024. Institute of Electrical and Electronics Engineers Inc., (Proceedings of the European Test Workshop).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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An On-Line Aging Detection and Tolerance Framework for Improving Reliability of STT-MRAMs
Chen, Y. G., Huang, P. Y. & Li, J. F., 16 Jan 2023, ASP-DAC 2023 - 28th Asia and South Pacific Design Automation Conference, Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 13-18 6 p. (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1 Scopus citations -
Fault-Aware ECC Scheme for Enhancing the Read Reliability of STT-MRAMs
Wu, M. S., Chua, Y. L., Li, J. F., Chuan, Y. T. & Huang, S. H., 2023, Proceedings - 7th IEEE International Test Conference in Asia, ITC-Asia 2023. Institute of Electrical and Electronics Engineers Inc., (Proceedings - 7th IEEE International Test Conference in Asia, ITC-Asia 2023).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2 Scopus citations -
Hardware Trojans of Computing-In-Memories: Issues and Methods
Huang, S. H., Cheng, W. C. & Li, J. F., 2023, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. Cassano, L., Psarakis, M., Traiola, M. & Bosio, A. (eds.). Institute of Electrical and Electronics Engineers Inc., (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability
Li, J. F., 2023, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. Cassano, L., Psarakis, M., Traiola, M. & Bosio, A. (eds.). Institute of Electrical and Electronics Engineers Inc., (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review