Projects per year
Personal profile
Research Expertise
Near-Data Processing, Internet of Things, Deep Learning
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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Dive into the research topics where Jin-Fu Li is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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Hardware Trojan Design With Low Overhead and High Destructiveness for STT-MRAM-Based CIMs
Cheng, W. C., Huang, S. H. & Li, J. F., 2025, (Accepted/In press) In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.Research output: Contribution to journal › Article › peer-review
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Efficient Built-In Self-Test Scheme for Inter-Die Interconnects of Chiplet-Based Chips
Huang, Y. C., Lin, P. Y., Li, J. F., Fu, H. S. & Lee, Y. P., 2024, Proceedings - 2024 IEEE International Test Conference, ITC 2024. Institute of Electrical and Electronics Engineers Inc., p. 149-156 8 p. (Proceedings - International Test Conference).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Parallel-Check Trimming Test Approach for Selecting the Reference Resistance of STT-MRAMs
Lin, P. Y. & Li, J. F., 2024, Proceedings - 2024 29th IEEE European Test Symposium, ETS 2024. Institute of Electrical and Electronics Engineers Inc., (Proceedings of the European Test Workshop).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Special Session: Testing of Digital Computing-In Memories with MAC Function
Li, J. F., 2024, 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2024. Institute of Electrical and Electronics Engineers Inc., (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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An On-Line Aging Detection and Tolerance Framework for Improving Reliability of STT-MRAMs
Chen, Y. G., Huang, P. Y. & Li, J. F., 16 Jan 2023, ASP-DAC 2023 - 28th Asia and South Pacific Design Automation Conference, Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 13-18 6 p. (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1 Scopus citations