Projects per year
Personal profile
Research Expertise
Near-Data Processing, Internet of Things, Deep Learning
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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Dive into the research topics where Jin-Fu Li is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
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Projects
- 15 Finished
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Robustness and Reliability Enhancement Techniques for Deep Neural Network Systems(3/3)
1/08/21 → 31/07/22
Project: Research
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Reconfigurable Deep Neural Network Techniques for Supervised Learning(3/3)
1/08/21 → 31/07/22
Project: Research
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Robustness and Reliability Enhancement Techniques for Deep Neural Network Systems(2/3)
1/08/20 → 31/07/21
Project: Research
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DFT-Enhanced Test Scheme for Spin-Transfer-Torque (STT) MRAMs
Pan, Z. W. & Li, J. F., 2022, Proceedings - 2022 IEEE International Test Conference, ITC 2022. Institute of Electrical and Electronics Engineers Inc., p. 489-493 5 p. (Proceedings - International Test Conference; vol. 2022-September).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Fault Modeling and Testing of RRAM-based Computing-In Memories
Yang, Y. C. & Li, J. F., 2022, Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022. Institute of Electrical and Electronics Engineers Inc., p. 7-12 6 p. (Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2 Scopus citations -
Foreword: ATS 2022
Li, J. F. & Liou, J. J., 2022, In: Proceedings of the Asian Test Symposium. 2022-November, p. XResearch output: Contribution to journal › Editorial
Open Access -
Testing and Reliability of Computing-In Memories: Solutions and Challenges
Li, J. F., 2022, Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022. Institute of Electrical and Electronics Engineers Inc., p. 55-60 6 p. (Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1 Scopus citations -
An Aging-Aware CMOS SRAM Structure Design for Boolean Logic In-Memory Computing
Chang, W., Chen, Y. G., Huang, P. Y. & Li, J. F., 2021, 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021. Dilillo, L., Cassano, L. & Papadimitriou, A. (eds.). Institute of Electrical and Electronics Engineers Inc., (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT; vol. 2021-October).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1 Scopus citations