Projects per year
Personal profile
Research Expertise
Neural network computing component design/operation/application, highly integrated resistive memory design/operation/application
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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Collaborations and top research areas from the last five years
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Projects
- 5 Finished
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1-Transistor 1-Source/Channel/Drain-Diode (1T1D) One-Time-Programmable Memory in 14-nm FinFET
Hsieh, E. R., Luo, Y. M., Huang, Y. X., Su, H. S., Lin, R. Q., Lin, Y. H., Chang, K. H., Shen, T. H. & Liu, C. H., 1 Mar 2023, In: IEEE Electron Device Letters. 44, 3, p. 404-407 4 p.Research output: Contribution to journal › Article › peer-review
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3-bits-per-cell 2T32CFEnvTCAM by Angstrom-laminated Ferroelectric Layers with 1011Cycles of Endurance and 4.92V of Ultra-wide Memory-windows for In-memory-searching
Hsieh, E. R., Tang, Y. T., Liu, C. R., Wang, S. M., Hsueh, Y. L., Lin, R. Q., Huang, Y. X. & Chen, Y. T., 2023, 2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023. Institute of Electrical and Electronics Engineers Inc., (Digest of Technical Papers - Symposium on VLSI Technology; vol. 2023-June).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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A 40-nm Loadless 4T-SRAM TRNG MACRO with Read-just-after-write (RAW) Scheme Featuring 5.3Gb/s and 3.64TOP/W
Wu, Y. S., Chang, K. H., Huang, P. S., Miu, M. L., Huang, S. Y., Lu, S. M., Su, H. S. & Hsieh, E. R., 2023, 2023 Silicon Nanoelectronics Workshop, SNW 2023. Institute of Electrical and Electronics Engineers Inc., p. 111-112 2 p. (2023 Silicon Nanoelectronics Workshop, SNW 2023).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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A Nonvolatile Ternary-Content-Addressable- Memory Comprising Resistive-Gate Field-Effect Transistors
Hsieh, E. R., Hsueh, Y. L., Lin, R. Q., Huang, Y. X., Hou, P. J., Chang, K. H., Shen, T. H., Li, Y. H. & Lyu, R. Y., 1 Aug 2023, In: IEEE Electron Device Letters. 44, 8, p. 1292-1295 4 p.Research output: Contribution to journal › Article › peer-review
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A Built-in Spice Time-domain Variation Model of the BTI-induced Random Trap Fluctuation (RTF) in 14 nm FinFETs
Lin, L. C., Wang, Z. Y., Lee, M. Y., Chang, J. K., Hsieh, E. R., Guo, J. C. & Chung, S. S., 2022, 2022 IEEE Silicon Nanoelectronics Workshop, SNW 2022. Institute of Electrical and Electronics Engineers Inc., (2022 IEEE Silicon Nanoelectronics Workshop, SNW 2022).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review