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Chun-Lung Hsu

Associate Professor

20022024

Research activity per year

Personal profile

Research Expertise

Software/hardware co-design for deep learning accelerator chip design, data-driven energy efficiency chip design, SDC (software-defined chip/chiplet) EDA technology, GAI (Generative AI) chip design technology

Expertise related to UN Sustainable Development Goals

In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):

  1. SDG 7 - Affordable and Clean Energy
    SDG 7 Affordable and Clean Energy

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Collaborations and top research areas from the last five years

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  • Special Session: Architecture-Level DCIM Technologies for Edge AI Computing Applications

    Hsu, C. L., Chen, H. Y. & Chen, Y. L., 2024, 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2024. Institute of Electrical and Electronics Engineers Inc., (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    1 Scopus citations

  • Wafer Defect Pattern Labeling and Recognition Using Semi-Supervised Learning

    Li, K. S. M., Jiang, X. H., Chen, L. L. Y., Wang, S. J., Huang, A. Y. A., Chen, J.-E., Liang, H. C. & Hsu, C. L., 1 May 2022, In: IEEE Transactions on Semiconductor Manufacturing. 35, 2, p. 291-299 9 p.

    Research output: Contribution to journal › Article › peer-review

    32 Scopus citations

  • Wafer Scratch Pattern Reconstruction for High Diagnosis Accuracy and Yield Optimization

    Li, K. S. M., Chen, L. L. Y., Liao, P. Y. Y., Wang, S. J., Huang, A. Y. A., Chou, L., Tsai, N. C. Y., Cheng, K. C. C., Han, G. C. H., Lee, C. S., Chen, J. E., Liang, H. C. & Hsu, C. L., 1 May 2022, In: IEEE Transactions on Semiconductor Manufacturing. 35, 2, p. 272-281 10 p.

    Research output: Contribution to journal › Article › peer-review

    9 Scopus citations

  • Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering

    Li, K. S. M., Li-Yang Chen, L., Cheng, K. C. C., Yi-Yu Liao, P., Wang, S. J., Huang, A. Y. A., Tsai, N., Chou, L., Han, G. C. H., Chen, J.-E., Liang, H. C. & Hsu, C. L., 24 May 2021, Proceedings - 2021 IEEE European Test Symposium, ETS 2021. Institute of Electrical and Electronics Engineers Inc., 9465457. (Proceedings of the European Test Workshop; vol. 2021-May).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    2 Scopus citations

  • Fault-Aware Dependability Enhancement Techniques for Phase Change Memory

    Lu, S. K., Li, H. P., Miyase, K., Hsu, C. L. & Sun, C. T., Aug 2021, In: Journal of Electronic Testing: Theory and Applications (JETTA). 37, 4, p. 503-513 11 p.

    Research output: Contribution to journal › Article › peer-review

    2 Scopus citations
View all 65 Research outputs