Projects per year
Personal profile
Research Expertise
Nano optoelectronic components, semiconductor optoelectronic components, electron beam lithography, plasma spectroscopy monitoring
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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Collaborations and top research areas from the last five years
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Projects
- 6 Finished
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Compound Films of Passivated Contact Technology Development and Application for Si-Based Optoelectronic Devices(2/2)
Lee, C.-C. (PI)
1/08/19 → 31/07/20
Project: Research
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Compound Films of Passivated Contact Technology Development and Application for Si-Based Optoelectronic Devices(1/2)
Lee, C.-C. (PI)
1/08/18 → 31/07/19
Project: Research
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Axicon metalens for broadband light harvesting
Chang, K. H., Chen, Y. C., Huang, Y. S., Hsu, W. L., Lu, G. H., Liu, C. F., Weng, C. J., Lin, Y. H., Chen, C. C., Lee, C. C., Chang, Y. C., Wang, P. H. & Wang, C. M., 1 Apr 2023, In: Nanophotonics. 12, 7, p. 1309-1315 7 p.Research output: Contribution to journal › Article › peer-review
Open Access4 Scopus citations -
Evolution of a-Si:H to nc-Si:H transition of hydrogenated silicon films deposited by trichlorosilane using principle component analysis of optical emission spectroscopy
Wang, S. H., Chang, H. E., Lee, C. C., Fuh, Y. K. & Li, T. T., 15 Jan 2020, In: Materials Chemistry and Physics. 240, 122186.Research output: Contribution to journal › Article › peer-review
13 Scopus citations -
Correlation of impedance matching and optical emission spectroscopy during plasma-enhanced chemical vapor deposition of nanocrystalline silicon thin films
Kau, L. H., Huang, H. J., Chang, H. E., Hsieh, Y. L., Lee, C. C., Fuh, Y. K. & Li, T. T., 1 May 2019, In: Coatings. 9, 5, 305.Research output: Contribution to journal › Article › peer-review
Open Access1 Scopus citations -
Large-scale data analysis of PECVD amorphous silicon interface passivation layer via the optical emission spectra for parameterized PCA
Huang, H. J., Kau, L. H., Wang, H. S., Hsieh, Y. L., Lee, C. C., Fuh, Y. K. & Li, T. T., 17 Mar 2019, In: International Journal of Advanced Manufacturing Technology. 101, 1-4, p. 329-337 9 p.Research output: Contribution to journal › Article › peer-review
8 Scopus citations -
Plasma process optimization of silicon film deposition from trichlorosiliane precursor with OES monitoring
Lee, C. C., Wang, S. H., Chang, H. E., Fuh, Y. K., Li, T. T., Chiou, Y. H. & Cheng, H. C., Mar 2019, China Semiconductor Technology International Conference 2019, CSTIC 2019. Claeys, C., Huang, R., Wu, H., Lin, Q., Liang, S., Song, P., Guo, Z., Lai, K., Zhang, Y., Qu, X., Lung, H.-L. & Yu, W. (eds.). Institute of Electrical and Electronics Engineers Inc., 8755637. (China Semiconductor Technology International Conference 2019, CSTIC 2019).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1 Scopus citations