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  • 1997

    Studies of the effects of multi-stack multiquantum barrier on the properties of 1.3 μm AlGaInAs/InP quantum well lasers

    Pan, J. W., Chyi, J. I., Tu, Y. K. & Liaw, J. W., 1997, Proceedings of the IEEE 24th International Symposium on Compound Semiconductors, ISCS 1997. Melloch, M. & Reed, M. A. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 401-404 4 p. 711671. (Proceedings of the IEEE 24th International Symposium on Compound Semiconductors, ISCS 1997).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 1996

    A fast and sensitive built-in current sensor for IDDQ testing

    Lu, C. W., Lee, C. L. & Chen, J. E., 1996, Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996. Tong, C. & Jayasuniana, A. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 56-58 3 p. 557816. (Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    18 Scopus citations
  • Application of EKF and RLS estimators in induction motor drive

    Lin, F. J., 1996, PESC Record - IEEE Annual Power Electronics Specialists Conference. p. 713-718 6 p. (PESC Record - IEEE Annual Power Electronics Specialists Conference; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    6 Scopus citations
  • 1994

    Algebraic division for multilevel logic synthesis of multi-valued logic circuits

    Wang, H. M., Lee, C. L. & Chen, J. E., 1994, Proceedings of The International Symposium on Multiple-Valued Logic. Publ by IEEE, p. 44-51 8 p. (Proceedings of The International Symposium on Multiple-Valued Logic).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    7 Scopus citations
  • Complete test set for multiple-valued logic networks

    Wang, H. M., Lee, C. L. & Chen, J. E., 1994, Proceedings of The International Symposium on Multiple-Valued Logic. Publ by IEEE, p. 289-296 8 p. (Proceedings of The International Symposium on Multiple-Valued Logic).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Distributed fault simulation for sequential circuits by pattern partitioning

    Wu, W. C., Lee, C. L., Chen, J. E. & Lin, W. Y., 1994, Proceedings of the European Design and Test Conference. Anon (ed.). Publ by IEEE, p. 661 1 p. (Proceedings of the European Design and Test Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • TRANS: A fast and memory-efficient path delay fault simulator

    Lin, M. C., Chen, J. E. & Lee, C. L., 1994, Proceedings of the European Design and Test Conference. Anon (ed.). Publ by IEEE, p. 508-512 5 p. (Proceedings of the European Design and Test Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • 1993

    An efficient trapped-charge calculation in amorphous silicon for device simulation

    Tsai, Y. T., Hong, K. D. & Yuan, Y. L., 1993, SMS 1993 Technical Digest - 1993 Symposium on Semiconductor Modeling and Simulation. Institute of Electrical and Electronics Engineers Inc., p. 75-76 2 p. 664564. (SMS 1993 Technical Digest - 1993 Symposium on Semiconductor Modeling and Simulation).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • A robust induction motor servo drive

    Liaw, C. M. & Lin, F. J., 1993, ISIE 1993 - Budapest: IEEE International Symposium on Industrial Electronics, Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 740-746 7 p. 268851. (IEEE International Symposium on Industrial Electronics).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    9 Scopus citations
  • A two-phase fault simulation scheme for sequential circuits

    Wu, W. C., Lee, C. L. & Chen, J. E., 1993, ATS 1993 Proceedings - 2nd Asian Test Symposium. IEEE Computer Society, p. 60-65 6 p. 398780. (Proceedings of the Asian Test Symposium).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Fabrication/characterization of a pseudomorphic Ga0.1In0.9P/InP MESFET

    Feng, M. S., Hsin, Y. M. & Wu, C. H., 1993, III-V Electronic and Photonic Device Fabrication and Performance. Publ by Materials Research Society, p. 61-66 6 p. (Materials Research Society Symposium Proceedings; vol. 300).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • New simplified method to design a robust position controller for a DC servomotor

    Jinn-Der, W., Yau-Tarng, J. & Kuo-chin, F., 1993, Proceedings of the 10th IEEE Region Conference on Computer, Communication, Control and Power Engineering. Publ by IEEE, p. 607-610 4 p. (Proceedings of the 10th IEEE Region Conference on Computer, Communication, Control and Power Engineering).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Pole-assignment robustness for discrete-time systems with multiple time-delays

    Wang, R. J. & Wang, W. J., 1993, Proceedings of the IEEE Conference on Decision and Control. Publ by IEEE, p. 3831-3834 4 p. (Proceedings of the IEEE Conference on Decision and Control; vol. 4).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    6 Scopus citations
  • 1992

    A new robust stability criterion for interval time-delay systems

    Wang, W. J., Chiou, J. S. & Jeng, Y. S., 1992, Proceedings of the IEEE International Conference on Systems Engineering. Institute of Electrical and Electronics Engineers Inc., p. 428-431 4 p. 236996. (Proceedings of the IEEE International Conference on Systems Engineering).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Control of indirect field-oriented induction motor drives considering the effects of dead-time and parameter variations

    Lin, F. J. & Liaw, C. M., 1992, Proceedings of the IEEE International Symposium on Industrial Electronics, ISIE 1992. Institute of Electrical and Electronics Engineers Inc., p. 658-662 5 p. 279684. (IEEE International Symposium on Industrial Electronics).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Fault analysis on two-level (K + 1)-valued logic circuits

    Wang, H. M., Lee, C. L. & Chen, J. E., May 1992, Proceedings of The International Symposium on Multiple-Valued Logic. Publ by IEEE, p. 181-188 8 p. (Proceedings of The International Symposium on Multiple-Valued Logic).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • High-speed four-phase CMOS logic for complex high-speed VLSI

    Wu, C. Y., Cheng, K. H. & Wang, J. S., 1992, 1992 IEEE International Symposium on Circuits and Systems, ISCAS 1992. Institute of Electrical and Electronics Engineers Inc., p. 1288-1291 4 p. 230269. (Proceedings - IEEE International Symposium on Circuits and Systems; vol. 3).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Timing-driven partial scan

    Jou, J. Y. & Cheng, K. T., 1992, 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers. Publ by IEEE, p. 404-407 4 p. (1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    15 Scopus citations
  • 1990

    A single-state-transition fault model for sequential machines

    Cheng, K. T. & Jou, J. Y., 1990, 1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers. Publ by IEEE, p. 226-229 4 p. (1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    22 Scopus citations
  • Functional test generation for finite state machines

    Cheng, K. T. & Jou, J. Y., Sep 1990, Digest of Papers - International Test Conference. Publ by IEEE, p. 162-168 7 p. (Digest of Papers - International Test Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    37 Scopus citations
  • Simulation based verification of register-transfer level behavioral synthesis tools

    Ernst, R., Sutarwala, S., Jou, J. Y. & Tong, M., 1990, Proceedings of the European Design Automation Conference, EDAC 1990. Institute of Electrical and Electronics Engineers Inc., p. 396-400 5 p. 136680. (Proceedings of the European Design Automation Conference, EDAC 1990).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • Single-fault fault collapsing analysis in sequential logic circuits

    Chen, J. E., Lee, C. L. & Shen, W. Z., Sep 1990, Digest of Papers - International Test Conference. Publ by IEEE, p. 809-814 6 p. (Digest of Papers - International Test Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • 1989

    TSG - A test system generator for debugging and regression test of high-level behavioral synthesis tools

    Ernst, R., Sutarwala, S. & Jou, J. Y., 1989, 20 Int Test Conf 1989 ITC. Anon (ed.). Publ by IEEE, p. 937 1 p. (20 Int Test Conf 1989 ITC).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 1988

    BECOME: Behavior level circuit synthesis based on structure mapping.

    Wei, R. S., Rothweiler, S. & Jou, J. Y., 1988, Proceedings - Design Automation Conference. Publ by IEEE, p. 409-414 6 p. (Proceedings - Design Automation Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • SLOPE: A test pattern generator based on stop line oriented path end algorithm

    Chuang, S. J., Lee, C. L., Shen, W. Z., Jen, C. W., Chen, J. E., Jing, S. C. & Chen, M. D., 1988, Proceedings - IEEE International Symposium on Circuits and Systems. Publ by IEEE, p. 437-439 3 p. (Proceedings - IEEE International Symposium on Circuits and Systems; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Testable PLA design with low overhead and ease of test generation

    Jou, J. Y., 1988, 1988 IEEE Int Conf Comput Des VLSI Comput Process ICCD 88 Proc. Publ by IEEE, p. 450-453 4 p. (1988 IEEE Int Conf Comput Des VLSI Comput Process ICCD 88 Proc).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 1985

    FAULT-TOLERANT FFT NETWORKS.

    Jou, J. Y. & Abraham, J. A., 1985, Digest of Papers - FTCS (Fault-Tolerant Computing Symposium). IEEE, p. 338-343 6 p. (Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    17 Scopus citations
  • 1984

    BUILT-IN TEST FOR VLSI FINITE-STATE MACHINES.

    Hua, K. A., Jou, J. Y. & Abraham, J. A., 1984, Digest of Papers - FTCS (Fault-Tolerant Computing Symposium). IEEE, p. 292-297 6 p. (Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    27 Scopus citations