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  • 1988

    BECOME: Behavior level circuit synthesis based on structure mapping.

    Wei, R. S., Rothweiler, S. & Jou, J. Y., 1988, Proceedings - Design Automation Conference. Publ by IEEE, p. 409-414 6 p. (Proceedings - Design Automation Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • SLOPE: A test pattern generator based on stop line oriented path end algorithm

    Chuang, S. J., Lee, C. L., Shen, W. Z., Jen, C. W., Chen, J. E., Jing, S. C. & Chen, M. D., 1988, Proceedings - IEEE International Symposium on Circuits and Systems. Publ by IEEE, p. 437-439 3 p. (Proceedings - IEEE International Symposium on Circuits and Systems; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Testable PLA design with low overhead and ease of test generation

    Jou, J. Y., 1988, 1988 IEEE Int Conf Comput Des VLSI Comput Process ICCD 88 Proc. Publ by IEEE, p. 450-453 4 p. (1988 IEEE Int Conf Comput Des VLSI Comput Process ICCD 88 Proc).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 1985

    FAULT-TOLERANT FFT NETWORKS.

    Jou, J. Y. & Abraham, J. A., 1985, Digest of Papers - FTCS (Fault-Tolerant Computing Symposium). IEEE, p. 338-343 6 p. (Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    17 Scopus citations
  • 1984

    BUILT-IN TEST FOR VLSI FINITE-STATE MACHINES.

    Hua, K. A., Jou, J. Y. & Abraham, J. A., 1984, Digest of Papers - FTCS (Fault-Tolerant Computing Symposium). IEEE, p. 292-297 6 p. (Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    27 Scopus citations